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esd 相关的电子技术资料，包括技术文档、应用笔记、电路设计、代码示例等，共 269 篇文章，持续更新中。
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ESD-Phenomena-and-the-Reliability
As we enter the next millennium, there are clear technological patterns. First, the<br />
electronic industry continues to scale microelectronic structures to achieve faster<br />
devices, new devices
Basic ESD Design Guidelines
ESD is a crucial factor for integrated circuits and influences their quality and reliability.<br />
Today increasingly sensitive processes with deep sub micron structures are developed. The<br />
inte
ESD+Circuits+and+Devices
In the field of electricity, electrostatics, and circuit theory, there are many discoveries and<br />
accomplishments that have lead to the foundation of the field of electrostatic discharge<br />
(ES
ESD+Basics
This text, ESD Basics: From Semiconductor Manufacturing to Product Use was initiated on<br />
the need to produce a text that addresses fundamentals of electrostatic discharge from the<br />
manufactu
ESD+and+Electronic+Equipment
Since electronic equipment was first developed, static electricity has been a<br />
source of problems for users and designers. In the last few years, however,<br />
electrostatic discharge (ESD) has
ESD_Technology
在互補式金氧半(CMOS)積體電路中，隨著量產製程<br />
的演進，元件的尺寸已縮減到深次微米(deep-submicron)階<br />
段，以增進積體電路(IC)的性能及運算速度，以及降低每<br />
顆晶片的製造成本。但隨著元件尺寸的縮減，卻出現一些<br />
可靠度的問題。<br />
ESD_Suggestion_for_HighSpeed_IO_Ker
Guideline Suggestion<br />
for High-Speed I/O ESD Protection<br />
ESD_protection_for_RF_and_AMS_ICs
This paper reviews key factors to practical ESD<br />
protection design for RF and analog/mixed-signal (AMS) ICs,<br />
including general challenges emerging, ESD-RFIC interactions,<br />
RF ESD desig
ESD - The Scourge of Electronics
This book on electrostatic discharge phenomena is essentially a translation and<br />
update ofa Swedish edition from 1992.<br />
The book is intended for people working with e
ESD Protection in CMOS ICs
在互補式金氧半(CMOS)積體電路中，隨著量產製程的演進，元件的尺寸已縮減到深次微<br />
米(deep-submicron)階段，以增進積體電路(IC)的性能及運算速度，以及降低每顆晶片的製造<br />
成本。但隨著元件尺寸的縮減，卻出現一些可靠度的問題。<br />
在次微米技術中，為了克服所謂熱載子(Hot-Carrier)問題而發展出 LDD(Lightly-Doped Drain)
ESD Protection Device and Circuit Design
The challenges associated with the design and implementation of Electro-<br />
static Discharge (ESD) protection circuits become increasingly complex as<br />
technology is scaled well into nano-metri
ESD Protection Development
The goal of this book is to introduce the simulation methods necessary to describe<br />
the behaviour of semiconductor devices during an electrostatic discharge (ESD).<br />
The challenge of this tas
ESD Program Management
Electrostatic discharge (ESD) events can have serious detrimental<br />
effects on the manufacture and performance of microelectronic devices,<br />
the
ESD In Silicon Integrated Circuits
In the seven years since the first edition of this book was completed, Electrostatic<br />
Discharge (ESD) phenomena in integrated circuits (IC) continues to be important<br />
as technologies shrink
ESD Design for Analog Circuits
Dear Reader, this book project brings to you a unique study tool for ESD<br />
protection solutions used in analog-integrated circuit (IC) design. Quick-start<br />
learning is combined with in-depth
ESD Circuits and Devices 2015
Electrostatic discharge (ESD) phenomena have been known to mankind since the Greek<br />
Empire when Thales of Miletus, one of the Seven Sages of Greece, noticed the attraction of<br />
strands of hay
ESD - RF Technology and Circuits
The phenomenon of electrostatic discharge (ESD) has been known for a long time, but<br />
recently a growing interest has been observed in ESD in radio frequency (RF) technology<br />
and ESD issues i
ESD - Physics and Devices
Electrostatic discharge (ESD) phenomena have been known to mankind since Thales of<br />
Miletus in approximately 600 B.C.E. noticed the attraction of strands of hay to amber.<br />
Two thousand six h
ESD - Failure Mechanisms and Models
Failure analysis is invaluable in the learning process of electrostatic discharge (ESD) and<br />
electrical overstress (EOS) protection design and development [1–8]. In the failure analysis<br />
of