ESD - Failure Mechanisms and Models - 免费下载
书籍资源
文件大小：13920 K
📋 资源详细信息
💡 温馨提示：本资源由用户 shancjb 上传分享，仅供学习交流使用。如有侵权，请联系我们删除。
资源简介
Failure analysis is invaluable in the learning process of electrostatic discharge (ESD) and
electrical overstress (EOS) protection design and development [1–8]. In the failure analysis
of EOS, ESD, and latchup events, there are a number of unique failure analysis processes
andinformationthatcanprovidesignificantunderstandingandillumination[4].Today,thereis
still no design methodology or computer-aided design (CAD) tool which will predict EOS,
ESDprotectionlevels,andlatchupinasemiconductorchip;thisisoneofthesignificantreasons
why failure analysis is critical to the ESD design discipline.
electrical overstress (EOS) protection design and development [1–8]. In the failure analysis
of EOS, ESD, and latchup events, there are a number of unique failure analysis processes
andinformationthatcanprovidesignificantunderstandingandillumination[4].Today,thereis
still no design methodology or computer-aided design (CAD) tool which will predict EOS,
ESDprotectionlevels,andlatchupinasemiconductorchip;thisisoneofthesignificantreasons
why failure analysis is critical to the ESD design discipline.
立即下载此资源
提示：下载后请用压缩软件解压，推荐使用 WinRAR 或 7-Zip
资源说明
下载说明
- 下载需消耗 2积分
- 24小时内重复下载不扣分
- 支持断点续传
- 资源永久有效
使用说明
- 下载后用解压软件解压
- 推荐 WinRAR 或 7-Zip
- 如有密码请查看说明
- 解压后即可使用
积分获取
- 上传资源获得积分
- 每日签到免费领取
- 邀请好友注册奖励
- 查看详情 →