ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上传时间： 2013-11-12
上传用户：pans0ul
摘要：从功率MOSFET内部结构和极间电容的电压依赖关系出发，对功率MOSFET的开关现象及其原因进行了较深入分析。从实际应用的角度，对功率MOSFET开关过程的功率损耗和所需驱动功率进行了研究，提出了有关参数的计算方法，并对多种因素对开关特性的影响效果进行了实验研究，所得出的结论对于功率MOSFET的正确运用和设计合理的MoSFET驱动电路具有指导意义．
上传时间： 2013-11-10
上传用户：wfeel
Power conversion by virtue of its basic role produces harmonics due to theslicing of either voltages or currents. To a large extent the pollution in theutility supply and the deterioration of the power quality has been generatedor created by non-linear converters. It is therefore ironic that power convertersshould now be used to clean up the pollution that they helped to create inthe first place.In a utility system, it is desirable to prevent harmonic currents (which resultin EMI and resonance problems) and limit reactive power flows (whichresult in transmission losses).Traditionally, shunt passive filters, comprised of tuned LC elements andcapacitor banks, were used to filter the harmonics and to compensate forreactive current due to non-linear loads. However, in practical applicationsthese methods have many disadvantages.
上传时间： 2013-11-05
上传用户：AISINI005
This reference design (RD) features a fullyassembled and tested surface-mount printed circuitboard (PCB). The RD board utilizes the MAX48851:2 or 2:1 multiplexer and other ICs to implement acomplete video graphics array (VGA) 8:1multiplexer.VGA input/output connections are provided to easilyinterface the MAX4885 RD board with VGAcompatibledevices. The RD board gives the optionto use a single 5V DC power supply (V+), or this RDboard can be powered from any one of the eight VGA sources.
标签： multiplexer reference VGA
上传时间： 2013-11-09
上传用户：ANRAN
OPTOELECTRONICS CIRCUIT COLLECTION AVALANCHE PHOTODIODE BIAS SUPPLY 1Provides an output voltage of 0V to +80V for reverse biasingan avalanche photodiode to control its gain. This circuit canalso be reconfigured to supply a 0V to –80V output.LINEAR TEC DRIVER–1This is a bridge-tied load (BTL) linear amplifier for drivinga thermoelectric cooler (TEC). It operates on a single +5Vsupply and can drive ±2A into a common TEC.LINEAR TEC DRIVER–2This is very similar to DRIVER–1 but its power output stagewas modified to operate from a single +3.3V supply in orderto increase its efficiency. Driving this amplifier from astandard +2.5V referenced signal causes the output transistorsto have unequal power dissipation.LINEAR TEC DRIVER–3This BTL TEC driver power output stage achieves very highefficiency by swinging very close to its supply rails, ±2.5V.This driver can also drive ±2A into a common TEC. Operationis shown with the power output stage operating on±1.5V supplies. Under these conditions, this linear amplifiercan achieve very high efficiency. Application ReportThe following collection of analog circuits may be useful in electro-optics applications such as optical networkingsystems. This page summarizes their salient characteristics.
上传时间： 2013-10-27
上传用户：落花无痕
Radio Frequency Integrated Circuit Design I enjoyed reading this book for a number of reasons. One reason is that itaddresses high-speed analog design in the context of microwave issues. This isan advanced-level book, which should follow courses in basic circuits andtransmission lines. Most analog integrated circuit designers in the past workedon applications at low enough frequency that microwave issues did not arise.As a consequence, they were adept at lumped parameter circuits and often notcomfortable with circuits where waves travel in space. However, in order todesign radio frequency (RF) communications integrated circuits (IC) in thegigahertz range, one must deal with transmission lines at chip interfaces andwhere interconnections on chip are far apart. Also, impedance matching isaddressed, which is a topic that arises most often in microwave circuits. In mycareer, there has been a gap in comprehension between analog low-frequencydesigners and microwave designers. Often, similar issues were dealt with in twodifferent languages. Although this book is more firmly based in lumped-elementanalog circuit design, it is nice to see that microwave knowledge is brought inwhere necessary.Too many analog circuit books in the past have concentrated first on thecircuit side rather than on basic theory behind their application in communications.The circuits usually used have evolved through experience, without asatisfying intellectual theme in describing them. Why a given circuit works bestcan be subtle, and often these circuits are chosen only through experience. Forthis reason, I am happy that the book begins first with topics that require anintellectual approach—noise, linearity and filtering, and technology issues. Iam particularly happy with how linearity is introduced (power series). In therest of the book it is then shown, with specific circuits and numerical examples,how linearity and noise issues arise.
上传时间： 2014-12-23
上传用户：han_zh
印刷电路板（PCB）设计解决方案市场和技术领军企业Mentor Graphics（Mentor Graphics）宣布推出HyperLynx® PI（电源完整性）产品，满足业内高端设计者对于高性能电子产品的需求。HyperLynx PI产品不仅提供简单易学、操作便捷，又精确的分析，让团队成员能够设计可行的电源供应系统；同时缩短设计周期，减少原型生成、重复制造，也相应降低产品成本。随着当今各种高性能/高密度/高脚数集成电路的出现，传输系统的设计越来越需要工程师与布局设计人员的紧密合作，以确保能够透过众多PCB电源与接地结构，为IC提供纯净、充足的电力。配合先前推出的HyperLynx信号完整性（SI）分析和确认产品组件，Mentor Graphics目前为用户提供的高性能电子产品设计堪称业内最全面最具实用性的解决方案。“我们拥有非常高端的用户，受到高性能集成电路多重电压等级和电源要求的驱使，需要在一个单一的PCB中设计30余套电力供应结构。”Mentor Graphics副总裁兼系统设计事业部总经理Henry Potts表示。“上述结构的设计需要快速而准 确的直流压降(DC Power Drop)和电源杂讯(Power Noise)分析。拥有了精确的分析信息，电源与接地层结构和解藕电容数(de-coupling capacitor number)以及位置都可以决定，得以避免过于保守的设计和高昂的产品成本。”
上传时间： 2013-11-18
上传用户：362279997
PCB LAYOUT 術語解釋(TERMS)1. COMPONENT SIDE(零件面、正面)︰大多數零件放置之面。2. SOLDER SIDE(焊錫面、反面)。3. SOLDER MASK(止焊膜面)︰通常指Solder Mask Open 之意。4. TOP PAD︰在零件面上所設計之零件腳PAD，不管是否鑽孔、電鍍。5. BOTTOM PAD：在銲錫面上所設計之零件腳PAD，不管是否鑽孔、電鍍。6. POSITIVE LAYER：單、雙層板之各層線路；多層板之上、下兩層線路及內層走線皆屬之。7. NEGATIVE LAYER：通常指多層板之電源層。8. INNER PAD：多層板之POSITIVE LAYER 內層PAD。9. ANTI-PAD：多層板之NEGATIVE LAYER 上所使用之絕緣範圍，不與零件腳相接。10. THERMAL PAD：多層板內NEGATIVE LAYER 上必須零件腳時所使用之PAD，一般稱為散熱孔或導通孔。11. PAD (銲墊)：除了SMD PAD 外，其他PAD 之TOP PAD、BOTTOM PAD 及INNER PAD 之形狀大小皆應相同。12. Moat : 不同信號的 Power& GND plane 之間的分隔線13. Grid : 佈線時的走線格點2. Test Point : ATE 測試點供工廠ICT 測試治具使用ICT 測試點 LAYOUT 注意事項:PCB 的每條TRACE 都要有一個作為測試用之TEST PAD(測試點)，其原則如下：1. 一般測試點大小均為30-35mil，元件分布較密時，測試點最小可至30mil.測試點與元件PAD 的距離最小為40mil。2. 測試點與測試點間的間距最小為50-75mil，一般使用75mil。密度高時可使用50mil,3. 測試點必須均勻分佈於PCB 上，避免測試時造成板面受力不均。4. 多層板必須透過貫穿孔(VIA)將測試點留於錫爐著錫面上(Solder Side)。5. 測試點必需放至於Bottom Layer6. 輸出test point report(.asc 檔案powerpcb v3.5)供廠商分析可測率7. 測試點設置處:Setuppadsstacks
上传时间： 2013-10-22
上传用户：pei5
Calculation of the Differential Impedance of Tracks on FR4 substrates There is a discrepancy between calculated and measured values of impedance for differential transmission lineson FR4. This is especially noticeable in the case of surface microstrip configurations. The anomaly is shown tobe due to the nature of the substrate material. This needs to be considered as a layered structure of epoxy resinand glass fibre. Calculations, using Boundary Element field methods, show that the distribution of the electricfield within this layered structure determines the apparent dielectric constant and therefore affects theimpedance. Thus FR4 cannot be considered to be uniform dielectric when calculating differential impedance.
上传时间： 2014-12-24
上传用户：DE2542
磁芯电感器的谐波失真分析 摘 要：简述了改进铁氧体软磁材料比损耗系数和磁滞常数ηB，从而降低总谐波失真THD的历史过程，分析了诸多因数对谐波测量的影响，提出了磁心性能的调控方向。 关键词：比损耗系数， 磁滞常数ηB ，直流偏置特性DC-Bias，总谐波失真THD Analysis on THD of the fer rite co res u se d i n i nductancShi Yan Nanjing Finemag Technology Co. Ltd., Nanjing 210033 Abstract: Histrory of decreasing THD by improving the ratio loss coefficient and hysteresis constant of soft magnetic ferrite is briefly narrated. The effect of many factors which affect the harmonic wave testing is analysed. The way of improving the performance of ferrite cores is put forward. Key words: ratio loss coefficient，hysteresis constant，DC-Bias，THD 近年来，变压器生产厂家和软磁铁氧体生产厂家，在电感器和变压器产品的总谐波失真指标控制上，进行了深入的探讨和广泛的合作，逐步弄清了一些似是而非的问题。从工艺技术上采取了不少有效措施，促进了质量问题的迅速解决。本文将就此热门话题作一些粗浅探讨。 一、 历史回顾 总谐波失真（Total harmonic distortion） ，简称THD，并不是什么新的概念，早在几十年前的载波通信技术中就已有严格要求<1>。1978年邮电部公布的标准YD/Z17－78“载波用铁氧体罐形磁心”中，规定了高μQ材料制作的无中心柱配对罐形磁心详细的测试电路和方法。如图一电路所示，利用LC组成的150KHz低通滤波器在高电平输入的情况下测量磁心产生的非线性失真。这种相对比较的实用方法，专用于无中心柱配对罐形磁心的谐波衰耗测试。 这种磁心主要用于载波电报、电话设备的遥测振荡器和线路放大器系统，其非线性失真有很严格的要求。 图中 ZD —— QF867 型阻容式载频振荡器，输出阻抗 150Ω， Ld47 —— 47KHz 低通滤波器，阻抗 150Ω，阻带衰耗大于61dB， Lg88 ——并联高低通滤波器，阻抗 150Ω，三次谐波衰耗大于61dB Ld88 ——并联高低通滤波器，阻抗 150Ω，三次谐波衰耗大于61dB FD —— 30～50KHz 放大器， 阻抗 150Ω， 增益不小于 43 dB，三次谐波衰耗b3(0)≥91 dB, DP —— Qp373 选频电平表，输入高阻抗， L ——被测无心罐形磁心及线圈， C ——聚苯乙烯薄膜电容器CMO-100V-707APF±0.5%,二只。 测量时，所配用线圈应用丝包铜电磁线SQJ9×0.12(JB661-75)在直径为16.1mm的线架上绕制 120 匝， （线架为一格） ， 其空心电感值为 318μH（误差1％） 被测磁心配对安装好后，先调节振荡器频率为 36.6～40KHz， 使输出电平值为+17.4 dB， 即选频表在 22′端子测得的主波电平 （P2）为+17.4 dB，然后在33′端子处测得输出的三次谐波电平（P3）， 则三次谐波衰耗值为：b3(+2)= P2+S+ P3 式中：S 为放大器增益dB 从以往的资料引证， 就可以发现谐波失真的测量是一项很精细的工作，其中测量系统的高、低通滤波器，信号源和放大器本身的三次谐波衰耗控制很严，阻抗必须匹配，薄膜电容器的非线性也有相应要求。滤波器的电感全由不带任何磁介质的大空心线圈绕成，以保证本身的“洁净” ，不至于造成对磁心分选的误判。 为了满足多路通信整机的小型化和稳定性要求， 必须生产低损耗高稳定磁心。上世纪 70 年代初，1409 所和四机部、邮电部各厂，从工艺上改变了推板空气窑烧结，出窑后经真空罐冷却的落后方式，改用真空炉，并控制烧结、冷却气氛。技术上采用共沉淀法攻关试制出了μQ乘积 60 万和 100 万的低损耗高稳定材料，在此基础上，还实现了高μ7000～10000材料的突破，从而大大缩短了与国外企业的技术差异。当时正处于通信技术由FDM（频率划分调制）向PCM（脉冲编码调制） 转换时期， 日本人明石雅夫发表了μQ乘积125 万为 0.8×10 ，100KHz）的超优铁氧体材料<3>，其磁滞系数降为优铁
上传时间： 2014-12-24
上传用户：7891
