Abstract: A perfect voltage reference produces a stable voltage independent of any external factors. Real-world voltagereferences, of course, are subject to errors caused by many external factors. One causeof these major errors istemperature. Without care, it is easy to operate a voltage reference outside its operating temperature range. Thisapplication note describes how references respond to temperature changes, and how self-heating can cause a voltagereference to operate outside its recommended temperature range. Once understood, this knowledge can then be used toavoid making this design error.
上传时间： 2013-11-08
上传用户：xianglee
Precision 16-bit analog outputs with softwareconfigurableoutput ranges are often needed in industrialprocess control equipment, analytical and scientificinstruments and automatic test equipment. In the past,designing a universal output module was a daunting taskand the cost and PCB real estate associated with thisfunction were problematic, if not prohibitive.
上传时间： 2014-12-23
上传用户：如果你也听说
Digital-to-analog converters (DACs) are prevalent inindustrial control and automated test applications.General-purpose automated test equipment often requiresmany channels of precisely controlled voltagesthat span several voltage ranges. The LTC2704 is ahighly integrated 16-bit, 4-channel DAC for high-endapplications. It has a wide range of features designed toincrease performance and simplify design.
上传时间： 2013-11-22
上传用户：元宵汉堡包
The STM32F10xxx microcontroller family embeds up to three advanced 12-bit ADCs (depending on the device) with a conversion time down to 1 μs. A self-calibration feature is provided to enhance ADC accuracy versus environmental condition changes.
上传时间： 2014-12-23
上传用户：eastimage
A complete design for a data acquisition card for the IBM PC is detailed in this application note. Additionally, C language code is provided to allow sampling of data at speed of more than 20kHz. The speed limitation is strictly based on the execution speed of the "C" data acquisition loop. A "Turbo" XT can acquire data at speeds greater than 20kHz. Machines with 80286 and 80386 processors can go faster than 20kHz. The computer that was used as a test bed in this application was an XT running at 4.77MHz and therefore all system timing and acquisition time measurements are based on a 4.77MHz clock speed.
上传时间： 2013-10-29
上传用户：BOBOniu
Low power operation of electronic apparatus has becomeincreasingly desirable. Medical, remote data acquisition,power monitoring and other applications are good candidatesfor battery driven, low power operation. Micropoweranalog circuits for transducer-based signal conditioningpresent a special class of problems. Although micropowerICs are available, the interconnection of these devices toform a functioning micropower circuit requires care. (SeeBox Sections, “Some Guidelines for Micropower Designand an Example” and “Parasitic Effects of Test Equipmenton Micropower Circuits.”) In particular, trade-offs betweensignal levels and power dissipation become painful whenperformance in the 10-bit to 12-bit area is desirable.
上传时间： 2013-10-22
上传用户：rocketrevenge
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上传时间： 2013-11-12
上传用户：pans0ul
随着科学技术的不断发展，人们的生活水平的不断提高，通信技术的不断扩延，计算机已经涉及到各个不同的行业，成为人们生活、工作、学习、娱乐不可缺少的工具。而计算机主板作为计算机中非常重要的核心部件，其品质的好坏直接影响计算机整体品质的高低。因此在生产主板的过程中每一步都是要严格把关的，不能有丝毫的懈怠，这样才能使其品质得到保证。 基于此，本文主要介绍电脑主板的SMT生产工艺流程和F/T(Function Test)功能测试步骤（F/T测试步骤以惠普H310机种为例）。让大家了解一下完整的计算机主板是如何制成的，都要经过哪些工序以及如何检测产品质量的。 本文首先简单介绍了PCB板的发展历史，分类，功能及发展趋势，SMT及SMT产品制造系统，然后重点介绍了SMT生产工艺流程和F/T测试步骤。
上传时间： 2013-11-06
上传用户：paladin
PCB 被动组件的隐藏特性解析 传统上，EMC一直被视为「黑色魔术（black magic）」。其实，EMC是可以藉由数学公式来理解的。不过，纵使有数学分析方法可以利用，但那些数学方程式对实际的EMC电路设计而言，仍然太过复杂了。幸运的是，在大多数的实务工作中，工程师并不需要完全理解那些复杂的数学公式和存在于EMC规范中的学理依据，只要藉由简单的数学模型，就能够明白要如何达到EMC的要求。本文藉由简单的数学公式和电磁理论，来说明在印刷电路板（PCB）上被动组件（passivecomponent）的隐藏行为和特性，这些都是工程师想让所设计的电子产品通过EMC标准时，事先所必须具备的基本知识。导线和PCB走线导线（wire）、走线（trace）、固定架……等看似不起眼的组件，却经常成为射频能量的最佳发射器（亦即，EMI的来源）。每一种组件都具有电感，这包含硅芯片的焊线（bond wire）、以及电阻、电容、电感的接脚。每根导线或走线都包含有隐藏的寄生电容和电感。这些寄生性组件会影响导线的阻抗大小，而且对频率很敏感。依据LC 的值（决定自共振频率）和PCB走线的长度，在某组件和PCB走线之间，可以产生自共振（self-resonance），因此，形成一根有效率的辐射天线。在低频时，导线大致上只具有电阻的特性。但在高频时，导线就具有电感的特性。因为变成高频后，会造成阻抗大小的变化，进而改变导线或PCB 走线与接地之间的EMC 设计，这时必需使用接地面（ground plane）和接地网格（ground grid）。导线和PCB 走线的最主要差别只在于，导线是圆形的，走线是长方形的。导线或走线的阻抗包含电阻R和感抗XL = 2πfL，在高频时，此阻抗定义为Z = R + j XL j2πfL，没有容抗Xc = 1/2πfC存在。频率高于100 kHz以上时，感抗大于电阻，此时导线或走线不再是低电阻的连接线，而是电感。一般而言，在音频以上工作的导线或走线应该视为电感，不能再看成电阻，而且可以是射频天线。
上传时间： 2013-10-09
上传用户：时代将军
PCB LAYOUT 術語解釋(TERMS)1. COMPONENT SIDE(零件面、正面)︰大多數零件放置之面。2. SOLDER SIDE(焊錫面、反面)。3. SOLDER MASK(止焊膜面)︰通常指Solder Mask Open 之意。4. TOP PAD︰在零件面上所設計之零件腳PAD，不管是否鑽孔、電鍍。5. BOTTOM PAD：在銲錫面上所設計之零件腳PAD，不管是否鑽孔、電鍍。6. POSITIVE LAYER：單、雙層板之各層線路；多層板之上、下兩層線路及內層走線皆屬之。7. NEGATIVE LAYER：通常指多層板之電源層。8. INNER PAD：多層板之POSITIVE LAYER 內層PAD。9. ANTI-PAD：多層板之NEGATIVE LAYER 上所使用之絕緣範圍，不與零件腳相接。10. THERMAL PAD：多層板內NEGATIVE LAYER 上必須零件腳時所使用之PAD，一般稱為散熱孔或導通孔。11. PAD (銲墊)：除了SMD PAD 外，其他PAD 之TOP PAD、BOTTOM PAD 及INNER PAD 之形狀大小皆應相同。12. Moat : 不同信號的 Power& GND plane 之間的分隔線13. Grid : 佈線時的走線格點2. Test Point : ATE 測試點供工廠ICT 測試治具使用ICT 測試點 LAYOUT 注意事項:PCB 的每條TRACE 都要有一個作為測試用之TEST PAD(測試點)，其原則如下：1. 一般測試點大小均為30-35mil，元件分布較密時，測試點最小可至30mil.測試點與元件PAD 的距離最小為40mil。2. 測試點與測試點間的間距最小為50-75mil，一般使用75mil。密度高時可使用50mil,3. 測試點必須均勻分佈於PCB 上，避免測試時造成板面受力不均。4. 多層板必須透過貫穿孔(VIA)將測試點留於錫爐著錫面上(Solder Side)。5. 測試點必需放至於Bottom Layer6. 輸出test point report(.asc 檔案powerpcb v3.5)供廠商分析可測率7. 測試點設置處:Setuppadsstacks
上传时间： 2013-10-22
上传用户：pei5
