Maxim Analog Essentials are a series of plug-in peripheral modules that allow engineers to quickly test, evaluate, and integrate Maxim components into their hardware/software designs. The modules electrically and physically conform to the Digilent Pmod™ interface specification and are compatible with any Digilent Pmod-compatible header.
标签： 模拟技术
上传时间： 2013-11-14
上传用户：ljj722
多反馈滤波器是一种流行的滤波器结构，以运算放大器作为积分器，如图1所示。因而，其传递函数对运算放大器参数的依赖度高于Sallen-Key设计。
标签： 反馈滤波器
上传时间： 2013-11-15
上传用户：robter
Precision 16-bit analog outputs with softwareconfigurableoutput ranges are often needed in industrialprocess control equipment, analytical and scientificinstruments and automatic test equipment. In the past,designing a universal output module was a daunting taskand the cost and PCB real estate associated with thisfunction were problematic, if not prohibitive.
上传时间： 2014-12-23
上传用户：如果你也听说
Digital-to-analog converters (DACs) are prevalent inindustrial control and automated test applications.General-purpose automated test equipment often requiresmany channels of precisely controlled voltagesthat span several voltage ranges. The LTC2704 is ahighly integrated 16-bit, 4-channel DAC for high-endapplications. It has a wide range of features designed toincrease performance and simplify design.
上传时间： 2013-11-22
上传用户：元宵汉堡包
A complete design for a data acquisition card for the IBM PC is detailed in this application note. Additionally, C language code is provided to allow sampling of data at speed of more than 20kHz. The speed limitation is strictly based on the execution speed of the "C" data acquisition loop. A "Turbo" XT can acquire data at speeds greater than 20kHz. Machines with 80286 and 80386 processors can go faster than 20kHz. The computer that was used as a test bed in this application was an XT running at 4.77MHz and therefore all system timing and acquisition time measurements are based on a 4.77MHz clock speed.
上传时间： 2013-10-29
上传用户：BOBOniu
Low power operation of electronic apparatus has becomeincreasingly desirable. Medical, remote data acquisition,power monitoring and other applications are good candidatesfor battery driven, low power operation. Micropoweranalog circuits for transducer-based signal conditioningpresent a special class of problems. Although micropowerICs are available, the interconnection of these devices toform a functioning micropower circuit requires care. (SeeBox Sections, “Some Guidelines for Micropower Designand an Example” and “Parasitic Effects of Test Equipmenton Micropower Circuits.”) In particular, trade-offs betweensignal levels and power dissipation become painful whenperformance in the 10-bit to 12-bit area is desirable.
上传时间： 2013-10-22
上传用户：rocketrevenge
ANALOG INPUT BANDWIDTH is a measure of the frequencyat which the reconstructed output fundamental drops3 dB below its low frequency value for a full scale input. Thetest is performed with fIN equal to 100 kHz plus integer multiplesof fCLK. The input frequency at which the output is −3dB relative to the low frequency input signal is the full powerbandwidth.APERTURE JITTER is the variation in aperture delay fromsample to sample. Aperture jitter shows up as input noise.APERTURE DELAY See Sampling Delay.BOTTOM OFFSET is the difference between the input voltagethat just causes the output code to transition to the firstcode and the negative reference voltage. Bottom Offset isdefined as EOB = VZT–VRB, where VZT is the first code transitioninput voltage and VRB is the lower reference voltage.Note that this is different from the normal Zero Scale Error.CONVERSION LATENCY See PIPELINE DELAY.CONVERSION TIME is the time required for a completemeasurement by an analog-to-digital converter. Since theConversion Time does not include acquisition time, multiplexerset up time, or other elements of a complete conversioncycle, the conversion time may be less than theThroughput Time.DC COMMON-MODE ERROR is a specification which appliesto ADCs with differential inputs. It is the change in theoutput code that occurs when the analog voltages on the twoinputs are changed by an equal amount. It is usually expressed in LSBs.
上传时间： 2013-11-12
上传用户：pans0ul
Construction Strategy of ESD Protection CircuitAbstract： The principles used to construct ESD protection on circuits and the basic conceptions of ESD protection design are presented.Key words：ESD protection/On circuit, ESD design window, ESD current path1 引言静电放电（ESD，Electrostatic Discharge）给电子器件环境会带来破坏性的后果。它是造成集成电路失效的主要原因之一。随着集成电路工艺不断发展，互补金属氧化物半导体（CMOS，Complementary Metal-Oxide Semiconductor）的特征尺寸不断缩小，金属氧化物半导体(MOS, Metal-Oxide Semiconductor)的栅氧厚度越来越薄，MOS 管能承受的电流和电压也越来越小，因此要进一步优化电路的抗ESD 性能，需要从全芯片ESD 保护结构的设计来进行考虑。
标签： Construction Strategy ESD of
上传时间： 2013-11-09
上传用户：Aidane
TCS ECN Background & Key TermsTrust Issues with PCIe PlatformsTCS ECN DetailsTrusted Config Space and TCS TransactionsTrusted Config Access Mech (TCAM)Standard vs Trusted Config AccessNew Capability StructuresTCS Support in Root Ports, Switches, & BridgesTCS “Does not…” ListExample Trusted Computing PlatformRevisiting the Trust IssuesKey Takeaways/Call to ActionQuestions
标签： Configuration Trusted PCIe Spa
上传时间： 2013-11-21
上传用户：hsfei8
随着科学技术的不断发展，人们的生活水平的不断提高，通信技术的不断扩延，计算机已经涉及到各个不同的行业，成为人们生活、工作、学习、娱乐不可缺少的工具。而计算机主板作为计算机中非常重要的核心部件，其品质的好坏直接影响计算机整体品质的高低。因此在生产主板的过程中每一步都是要严格把关的，不能有丝毫的懈怠，这样才能使其品质得到保证。 基于此，本文主要介绍电脑主板的SMT生产工艺流程和F/T(Function Test)功能测试步骤（F/T测试步骤以惠普H310机种为例）。让大家了解一下完整的计算机主板是如何制成的，都要经过哪些工序以及如何检测产品质量的。 本文首先简单介绍了PCB板的发展历史，分类，功能及发展趋势，SMT及SMT产品制造系统，然后重点介绍了SMT生产工艺流程和F/T测试步骤。
上传时间： 2013-11-06
上传用户：paladin
