Vienna LTE-Advanced Simulators
In this first part of the book the Vienna Link Level (LL) Simulators are described. The first chapte...
In this first part of the book the Vienna Link Level (LL) Simulators are described. The first chapte...
Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of electronic ...
Electrostatic discharge (ESD) phenomena have been known to mankind since the Greek Empire when Thale...
ESD is a crucial factor for integrated circuits and influences their quality and reliability. Today ...
As we enter the next millennium, there are clear technological patterns. First, the electronic indus...
Microengineering and Microelectromechanical systems (MEMS) have very few watertight definitions rega...
Since the original publication of Manual 74 in 1991, and the preceding “Guidelines for Transmission ...
This paper presents a new type of electromagnetic damper with rotating inertial mass that has been...
German universities and scientists have repeatedly set the intermational standard in drive technolog...
谭浩强《C程序设计》随书光盘教学视频共51讲2.38G -2016-01-31 08:12 C专家编程 -2015-11-14 11:24 c语言图形编程技术 -2015-11-14 11:...