A Built-in Self-Test for Soc
A Built-in Self-Test for Soc...
A Built-in Self-Test for Soc...
A BIST (BUILT-IN SELF-TEST) STRATEGY FOR MIXED-SIGNAL INTEGRATED CIRCUITS...
资料->【E】光盘论文->【E5】英文书籍->High Performance Memory Testing Design Principles, Fault Modeling and Self-Test (英).pdf...
是一本介绍java基础应用的好书 Java For Artists targets both the undergraduate computer science or information technology student and the practicing programmer. It...
可测试性设计(Design-For-Testability,DFT)已经成为芯片设计中不可或缺的重要组成部分。它通过在芯片的逻辑设计中加入测试逻辑提高芯片的可测试性。在高性能通用 CPU 的设计中,可测试性设计技术得到了广泛的应用。本文结合几款流行的 CPU,综述了可应用于通用 CPU 等高性能芯片...