一种硬件描述语言（HDL），英文全称为Very High Speed Integrated Circuit Hardware Description Language ，超高速集成电路硬件描述语言。
上传时间： 2016-05-12
上传用户：waizhang
VHDL是由美国国防部为描述电子电路所开发的一种语言，其全称为(Very High Speed Integrated Circuit) Hardware Description Language。 与另外一门硬件描述语言Verilog HDL相比，VHDL更善于描述高层的一些设计，包括系统级（算法、数据通路、控制）和行为级（寄存器传输级），而且VHDL具有设计重用、大型设计能力、可读性强、易于编译等优点逐渐受到硬件设计者的青睐。但是，VHDL是一门语法相当严格的语言，易学性差，特别是对于刚开始接触VHDL的设计者而言，经常会因某些小细节处理不当导致综合无法通过。为此本文就其中一些比较典型的问题展开探讨，希望对初学者有所帮助，提高学习进度。
上传时间： 2017-02-18
上传用户：nanshan
特点： 精确度0.1%满刻度 可作各式數學演算式功能如:A+B/A-B/AxB/A/B/A&B(Hi or Lo)/|A|/ 16 BIT类比输出功能 输入与输出绝缘耐压2仟伏特/1分钟(input/output/power) 宽范围交直流兩用電源設計 尺寸小,穩定性高
上传时间： 2014-12-23
上传用户：ydd3625
High input impedance and a wide input range are twohighly desirable features in a precision analog-to-digitalconverter, and the LTC®2449 delta-sigma ADC has both.With just a few external components, the LTC2449 formsan exceptional measurement system with very high inputimpedance and an input range that extends 300mV beyondthe supply rails.
上传时间： 2013-11-02
上传用户：ywcftc277
OPTOELECTRONICS CIRCUIT COLLECTION AVALANCHE PHOTODIODE BIAS SUPPLY 1Provides an output voltage of 0V to +80V for reverse biasingan avalanche photodiode to control its gain. This circuit canalso be reconfigured to supply a 0V to –80V output.LINEAR TEC DRIVER–1This is a bridge-tied load (BTL) linear amplifier for drivinga thermoelectric cooler (TEC). It operates on a single +5Vsupply and can drive ±2A into a common TEC.LINEAR TEC DRIVER–2This is very similar to DRIVER–1 but its power output stagewas modified to operate from a single +3.3V supply in orderto increase its efficiency. Driving this amplifier from astandard +2.5V referenced signal causes the output transistorsto have unequal power dissipation.LINEAR TEC DRIVER–3This BTL TEC driver power output stage achieves very highefficiency by swinging very close to its supply rails, ±2.5V.This driver can also drive ±2A into a common TEC. Operationis shown with the power output stage operating on±1.5V supplies. Under these conditions, this linear amplifiercan achieve very high efficiency. Application ReportThe following collection of analog circuits may be useful in electro-optics applications such as optical networkingsystems. This page summarizes their salient characteristics.
上传时间： 2013-10-27
上传用户：落花无痕
What would happen if someone connected 24V to your12V circuits? If the power and ground lines were inadvertentlyreversed, would the circuits survive? Does yourapplication reside in a harsh environment, where the inputsupply can ring very high or even below ground? Evenif these events are unlikely, it only takes one to destroya circuit board.
上传时间： 2013-10-26
上传用户：jackandlee
/*--------- 8051内核特殊功能寄存器 -------------*/ sfr ACC = 0xE0; //累加器 sfr B = 0xF0; //B 寄存器 sfr PSW = 0xD0; //程序状态字寄存器 sbit CY = PSW^7; //进位标志位 sbit AC = PSW^6; //辅助进位标志位 sbit F0 = PSW^5; //用户标志位0 sbit RS1 = PSW^4; //工作寄存器组选择控制位 sbit RS0 = PSW^3; //工作寄存器组选择控制位 sbit OV = PSW^2; //溢出标志位 sbit F1 = PSW^1; //用户标志位1 sbit P = PSW^0; //奇偶标志位 sfr SP = 0x81; //堆栈指针寄存器 sfr DPL = 0x82; //数据指针0低字节 sfr DPH = 0x83; //数据指针0高字节 /*------------ 系统管理特殊功能寄存器 -------------*/ sfr PCON = 0x87; //电源控制寄存器 sfr AUXR = 0x8E; //辅助寄存器 sfr AUXR1 = 0xA2; //辅助寄存器1 sfr WAKE_CLKO = 0x8F; //时钟输出和唤醒控制寄存器 sfr CLK_DIV = 0x97; //时钟分频控制寄存器 sfr BUS_SPEED = 0xA1; //总线速度控制寄存器 /*----------- 中断控制特殊功能寄存器 --------------*/ sfr IE = 0xA8; //中断允许寄存器 sbit EA = IE^7; //总中断允许位 sbit ELVD = IE^6; //低电压检测中断控制位 8051
上传时间： 2013-10-30
上传用户：yxgi5
TLC2543是TI公司的12位串行模数转换器，使用开关电容逐次逼近技术完成A/D转换过程。由于是串行输入结构，能够节省51系列单片机I/O资源；且价格适中，分辨率较高，因此在仪器仪表中有较为广泛的应用。 TLC2543的特点 （1）12位分辩率A/D转换器； （2）在工作温度范围内10μs转换时间； （3）11个模拟输入通道； （4）3路内置自测试方式； （5）采样率为66kbps； （6）线性误差±1LSBmax； （7）有转换结束输出EOC； （8）具有单、双极性输出； （9）可编程的MSB或LSB前导； （10）可编程输出数据长度。 TLC2543的引脚排列及说明 TLC2543有两种封装形式：DB、DW或N封装以及FN封装，这两种封装的引脚排列如图1，引脚说明见表1 TLC2543电路图和程序欣赏 #include<reg52.h> #include<intrins.h> #define uchar unsigned char #define uint unsigned int sbit clock=P1^0; sbit d_in=P1^1; sbit d_out=P1^2; sbit _cs=P1^3; uchar a1,b1,c1,d1; float sum,sum1; double sum_final1; double sum_final; uchar duan[]={0x3f,0x06,0x5b,0x4f,0x66,0x6d,0x7d,0x07,0x7f,0x6f}; uchar wei[]={0xf7,0xfb,0xfd,0xfe}; void delay(unsigned char b) //50us { unsigned char a; for(;b>0;b--) for(a=22;a>0;a--); } void display(uchar a,uchar b,uchar c,uchar d) { P0=duan[a]|0x80; P2=wei[0]; delay(5); P2=0xff; P0=duan[b]; P2=wei[1]; delay(5); P2=0xff; P0=duan[c]; P2=wei[2]; delay(5); P2=0xff; P0=duan[d]; P2=wei[3]; delay(5); P2=0xff; } uint read(uchar port) { uchar i,al=0,ah=0; unsigned long ad; clock=0; _cs=0; port<<=4; for(i=0;i<4;i++) { d_in=port&0x80; clock=1; clock=0; port<<=1; } d_in=0; for(i=0;i<8;i++) { clock=1; clock=0; } _cs=1; delay(5); _cs=0; for(i=0;i<4;i++) { clock=1; ah<<=1; if(d_out)ah|=0x01; clock=0; } for(i=0;i<8;i++) { clock=1; al<<=1; if(d_out) al|=0x01; clock=0; } _cs=1; ad=(uint)ah; ad<<=8; ad|=al; return(ad); } void main() { uchar j; sum=0;sum1=0; sum_final=0; sum_final1=0; while(1) { for(j=0;j<128;j++) { sum1+=read(1); display(a1,b1,c1,d1); } sum=sum1/128; sum1=0; sum_final1=(sum/4095)*5; sum_final=sum_final1*1000; a1=(int)sum_final/1000; b1=(int)sum_final%1000/100; c1=(int)sum_final%1000%100/10; d1=(int)sum_final%10; display(a1,b1,c1,d1); } }
上传时间： 2013-11-19
上传用户：shen1230
#include<iom16v.h> #include<macros.h> #define uint unsigned int #define uchar unsigned char uint a,b,c,d=0; void delay(c) { for for(a=0;a<c;a++) for(b=0;b<12;b++); }; uchar tab[]={ 0xc0,0xf9,0xa4,0xb0,0x99,0x92,0x82,0xf8,0x80,0x90,
上传时间： 2013-10-21
上传用户：13788529953
针对当前安检力学试验机所能完成的试验种类单一、自动化程度低等问题，提出一种以ATmega128单片机为核心控制器的安检力学试验机的设计。详细阐述了该安检力学试验机各个组成部分的设计原理和方案，并且给出了各部分的软件设计思想和操作流程。经过大量测试试验表明：设计的安检力学试验机可以完成多达十余种的力学安检试验，完全符合相关国家标准，并且具有数据采集精度高、传输速度快、操作安全简便等特点，实现了安检设备的多功能化、数字化和自动化。 Abstract: Currently， many mechanical security testing machines have only one function. The degree of automation of them is low. To solve those problems， a new kind of mechanical security testing machine， using ATmega128 micro-controller as its core controller， has been advanced. It describes the components of the machine. The principles and the scheme in the designing processes are presented in detail， and the software architecture and the operation processes of each part are given. After having done many testing， we have reached the following conclusions: the mechanical security testing machine presented can do over ten mechanical security tests complying with related national standards. It has high data acquisition accuracy and high transmission speed. The operation of the machine is simple and safe. In general， this machine is a multi-functional， highly automatic， digitalized security testing device.
上传时间： 2013-11-05
上传用户：a67818601
