Testability is the concern most often voiced by Texas Instruments (TIä ) application specific i
Testability is the concern most often voiced by Texas Instruments (TIä ) application specific i...
Testability is the concern most often voiced by Texas Instruments (TIä ) application specific i...
中科院研究生院VLSI测试课程课件,VLSI TEST PRINCIPLES AND ARCHITECTURES Design for Testability,搞好测试必看。...
可测试性设计(Design-For-Testability,DFT)已经成为芯片设计中不可或缺的重要组成部分。它通过在芯片的逻辑设计中加入测试逻辑提高芯片的可测试性。在高性能通用 CPU 的设计中,可...