Vienna LTE-Advanced Simulators
In this first part of the book the Vienna Link Level (LL) Simulators are described. The first chapter provides basics of LL simulations, introduces th...
In this first part of the book the Vienna Link Level (LL) Simulators are described. The first chapter provides basics of LL simulations, introduces th...
Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of electronic components. It is an event in which a finite amoun...
Electrostatic discharge (ESD) phenomena have been known to mankind since the Greek Empire when Thales of Miletus, one of the Seven Sages of Greece, no...
ESD is a crucial factor for integrated circuits and influences their quality and reliability. Today increasingly sensitive processes with deep sub mic...
As we enter the next millennium, there are clear technological patterns. First, the electronic industry continues to scale microelectronic structures ...