Boundary

共 83 篇文章
Boundary 相关的电子技术资料,包括技术文档、应用笔记、电路设计、代码示例等,共 83 篇文章,持续更新中。

ARMJTAG调试原理

介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍,在此基础上,结合ARM7TDMI详细介绍了的JTAG调试原理。

04 calgary PhD Numerical Solutions to Altimetry-Gravimetry Boundary Value Problems in Coastal Region

资料->【E】光盘论文->【E1】斯坦福博士论文->04 calgary PhD Numerical Solutions to Altimetry-Gravimetry Boundary Value Problems in Coastal Regions.pdf

BSDJTAG

Boundary Scan File FormatsBoundary Scan File FormatsBoundary Scan File FormatsBoundary Scan File FormatsBoundary Scan File Formats

期刊论文:Stereo Matching on Objects with Fractional Boundary [cvpr07]

·Stereo Matching on Objects with Fractional Boundary [cvpr07]

使用XC9500 JTAG边界扫描接口

IEEE Boundary-Scan Standard 1149.1, also known as<BR>JTAG, is a testing standard that uses software

在边界扫描系统中运用在系统编程

The XC9500 family performs both in-system programming and IEEE 1149.1 boundary-scan (JTAG) testing v

使用XC9500 JTAG边界扫描接口

IEEE Boundary-Scan Standard 1149.1, also known as<BR>JTAG, is a testing standard that uses software

一种单片机的在线编程测试方法研究

<p>单片机是一种集成电路芯片,在工业控制领域得到广泛的应用。而传统的单片机测试方法是先编程后上测试机测试,依赖下载器和人工操作,导致生产效率偏低。该文研究了基于ATE测试系统的单片机在线编程测试方法。以C8051F061型单片机电路为例,利用JTAG边界扫描原理设计了基于J750EX测试系统的单片机的在线测试方案,实现了J750EX测试系统对单片机的在线编程测试。实验结果表明,一种单片机的在线编

83390067ARMJTAG.rar

这篇文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍,在此基础上,结合ARM7TDMI详细介绍了的JTAG调试原理

Boundary-Scan Tutorial

Boundary-Scan Tutorial

STM32边界扫描描述文件 (STM32 Boundary Scan Description Language (BSDL) files)

JTAG基础知识

<p>IEEE1149.1的产生</p><p>1985年由IBM、AT&amp;T、Texas Instruments、Philips Electronics NV、Siemens、Alcatel和Ericsson等公司成立的JETAG</p><p>(Joint European Test Action Group)提出了边界扫描技术。1986年由于其它地区的一些公司的加入,JETAG改名为JTA

应用ANSOFT-HFSS对曲面结构贴片天线的模拟

<p>结构体的具体尺寸如下所示:a=1.20<br/>h=0.620其中介质锥的介电常数E=2.0。选定工作频率为f=15GHz相对应的真空中的波长为0=20<br/>mm,这样结构体的儿何尺寸己经完全确定,下面介绍求解的全过程选定求解方式为(Solution Type)Driven modal<br/>1.建立所求结构体的几何模型(单位:mm)。<br/>由于此结构体的几何形状较简单,使用工具栏

50W隔离型离线式DC.pdf

<p>ABSTRACT</p><p>The flyback power stage is a popular choice for single and multiple output dc-to-dc converters at power</p><p>levels of 150 Watts or less. Without the output inductor required in buc

CPU可测试性设计

<p><span style="font-size: 9pt; font-family: 宋体;">可测试性设计(Design-For-Testability,DFT)已经成为芯片设计中不可或缺的重要组成部分。它通过在</span></p><p><span style="font-size: 9pt; font-family: 宋体;">芯片的逻辑设计中加入测试逻辑提高芯片的可测试性。在高性能通用

2民生行用卡源代码

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The decision of a boundary problem for the equation of Puassona Method of splittings usual and повы

The decision of a boundary problem for the equation of Puassona Method of splittings usual and повышеной accuracy

The decision of a boundary problem for the differential equation of elliptic type of the second orde

The decision of a boundary problem for the differential equation of elliptic type of the second order a splitting method

The decision of a boundary problem a method of Galerkin

The decision of a boundary problem a method of Galerkin

This program incorporates the FV method for solving the Navier-Stokes equations using 2D, Cartesian

This program incorporates the FV method for solving the Navier-Stokes equations using 2D, Cartesian grids and the staggered arrangement of variables. Variables are stored as 2D arrays. SIMPLE method i