一种单片机的在线编程测试方法研究

单片机是一种集成电路芯片,在工业控制领域得到广泛的应用。而传统的单片机测试方法是先编程后上测试机测试,依赖下载器和人工操作,导致生产效率偏低。该文研究了基于ATE测试系统的单片机在线编程测试方法。以C8051F061型单片机电路为例,利用JTAG边界扫描原理设计了基于J750EX测试系统的单片机的在线测试方案,实现了J750EX测试系统对单片机的在线编程测试。实验结果表明,一种单片机的在线编程测试方法一方面解决了传统测试方法依赖下载器的问题,另一方面减少了测试过程中的人工操作,提高了生产效率,能够满足C8051F061型单片机的编程测试需求。

MCU is a kind of integrated circuit chip,which is widely used in the field of industrial control.The traditional MCU testing method is programming at first then testing on ATE(Automatic Test Machine).It is based on downloaders and manual operations so that it causes low efficiency on productions.This paper investigates the on-line programming and testing method of MCU based on ATE.We choose C8051 F061 as the example that the on-line programming test of MCU based on J750 EX test system is designed by using JTAG boundary scan principle,which realize the on-line programming test of MCU on J570 EX test system.The experimental results show that an on-line programming test method for MCU can not only solves the problem that the additivity of downloaders by traditional test method but also reduces the manual operation in the testing process and improves production efficiency,which meets the programming test requirements of C8051 F061 MCU.

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