📄 mcu_test.vhd
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LIBRARY IEEE;
USE IEEE.STD_LOGIC_1164.ALL;
USE IEEE.STD_LOGIC_UNSIGNED.ALL;
ENTITY MCU_TEST IS
PORT(EN:IN STD_LOGIC;
FRE_OUT:OUT STD_LOGIC_VECTOR(31 DOWNTO 0);
FM_OUT:OUT STD_LOGIC_VECTOR(31 DOWNTO 0);
PHA_OUT:OUT STD_LOGIC_VECTOR(15 DOWNTO 0);
SEL_OUT:OUT STD_LOGIC_VECTOR(2 DOWNTO 0)
);
END ENTITY;
ARCHITECTURE BEHAV OF MCU_TEST IS
BEGIN
FRE_OUT<="00000001010001111010111000010100"; --1M载波
FM_OUT<="00000000000011110100011011011100";
PHA_OUT<="0000000000000000"; --初相位为0
SEL_OUT<="001";
END;
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