随着半导体工艺的飞速发展和芯片设计水平的不断进步，ARM微处理器的性能得到大幅度地提高，同时其芯片的价格也在不断下降，嵌入式系统以其独有的优势，己经广泛地渗透到科学研究和日常生活的各个方面。 本文以ARM7 LPC2132处理器为核心，结合盖革一弥勒计数管对Time-To-Count辐射测量方法进行研究。ARM结构是基于精简指令集计算机(RISC)原理而设计的，其指令集和相关的译码机制比复杂指令集计算机要简单得多，使用一个小的、廉价的ARM微处理器就可实现很高的指令吞吐量和实时的中断响应。基于ARM7TDMI-S核的LPC2132微处理器，其工作频率可达到60MHz，这对于Time-To-Count技术是非常有利的，而且利用LPC2132芯片的定时/计数器引脚捕获功能，可以直接读取TC中的计数值，也就是说不再需要调用中断函数读取TC值，从而大大降低了计数前杂质时间。本文是在我师兄吕军的《Time-To-Count测量方法初步研究》基础上，使用了高速的ARM芯片，对基于MCS-51的Time-To-Count辐射测量系统进行了改进，进一步论证了采用高速ARM处理器芯片可以极大的提高G-M计数器的测量范围与测量精度。 首先，讨论了传统的盖革-弥勒计数管探测射线强度的方法，并指出传统的脉冲测量方法的不足。然后讨论了什么是Time-To-Count测量方法，对Time-To-Count测量方法的理论基础进行分析。指出Time-To-Count方法与传统的脉冲计数方法的区别，以及采用Time-To-Count方法进行辐射测量的可行性。 接着，详细论述基于ARM7 LPC2132处理器的Time-To-Count辐射测量仪的原理、功能、特点以及辐射测量仪的各部分接口电路设计及相关程序的编制。 最后得出结论，通过高速32位ARM处理器的使用，Time-To-Count辐射测量仪的精度和量程均得到很大的提高，对于Y射线总量测量，使用了ARM处理器的Time-To-Count辐射测量仪的量程约为20 u R/h到1R/h，数据线性程度也比以前的Time-To-CotJnt辐射测量仪要好。所以在使用Time-To-Count方法进行的辐射测量时，如何减少杂质时间以及如何提高计数前时间的测量精度，是决定Time-To-Count辐射测量仪性能的关键因素。实验用三只相同型号的J33G-M计数管分别作为探测元件，在100U R/h到lR/h的辐射场中进行试验.每个测量点测量5次取平均，得出随着照射量率的增大，辐射强度R的测量值偏小且与辐射真实值之间的误差也随之增大。如果将测量误差限定在10％的范围内，则此仪器的量程范围为20 u R/h至1R/h，量程跨度近六个数量级。而用J33型G-M计数管作常规的脉冲测量，量程范围约为50 u R/h到5000 u R/h，充分体现了运用Time-To-Count方法测量辐射强度的优越性，也从另一个角度反应了随着计数前时间的逐渐减小，杂质时间在其中的比重越来越大，对测量结果的影响也就越来越严重，尽可能的减小杂质时间在Time-To-Count方法辐射测量特别是测量高强度辐射中是关键的。笔者用示波器测出此辐射仪器的杂质时间约为6.5 u S，所以在计算定时器值的时候减去这个杂质时间，可以增加计数前时间的精确度。通过实验得出，在标定仪器的K值时，应该在照射量率较低的条件下行，而测得的计数前时间是否精确则需要在照射量率较高的条件下通过仪器标定来检验。这是因为在照射量率较低时，计数前时间较大，杂质时间对测量结果的影响不明显，数据线斜率较稳定，适宜于确定标定系数K值，而在照射量率较高时，计数前时间很小，杂质时间对测量结果的影响较大，可以明显的在数据线上反映出来，从而可以很好的反应出仪器的性能与量程。实验证明了Time-To-Count测量方法中最为关键的环节就是如何对计数前时间进行精确测量。经过对大量实验数据的分析，得到计数前时间中的杂质时间可分为硬件杂质时间和软件杂质时间，并以软件杂质时间为主，通过对程序进行合理优化，软件杂质时间可以通过程序的改进而减少，甚至可以用数学补偿的方法来抵消，从而可以得到比较精确的计数前时间，以此得到较精确的辐射强度值。对于本辐射仪，用户可以选择不同的工作模式来进行测量，当辐射场较弱时，通常采用规定次数测量的方式，在辐射场较强时，应该选用定时测量的方式。因为，当辐射场较弱时，如果用规定次数测量的方式，会浪费很多时间来采集足够的脉冲信号。当辐射场较强时，由于辐射粒子很多，产生脉冲的频率就很高，规定次数的测量会加大测量误差，当选用定时测量的方式时，由于时间的相对加长，所以记录的粒子数就相对的增加，从而提高仪器的测量精度。通过调研国内外先进核辐射测量仪器的发展现状，了解到了目前最新的核辐射总量测量技术一Time-To-Count理论及其应用情况。论证了该新技术的理论原理，根据此原理，结合高速处理器ARM7 LPC2132，对以G-计数管为探测元件的Time-To-Count辐射测量仪进行设计。论文以实验的方法论证了Time-To-Count原理测量核辐射方法的科学性，该辐射仪的量程和精度均优于以前以脉冲计数为基础理论的MCS-51核辐射测量仪。该辐射仪具有量程宽、精度高、易操作、用户界面友好等优点。用户可以定期的对仪器的标定，来减小由于电子元件的老化对低仪器性能参数造成的影响，通过Time-To-Count测量方法的使用，可以极大拓宽G-M计数管的量程。就仪器中使用的J33型G-M计数管而言，G-M计数管厂家参考线性测量范围约为50 u R/h到5000 u R/h，而用了Time-To-Count测量方法后，结合高速微处理器ARM7 LPC2132，此核辐射测量仪的量程为20 u R/h至1R/h。在允许的误差范围内，核辐射仪的量程比以前基于MCS-51的辐射仪提高了近200倍，而且精度也比传统的脉冲计数方法要高，测量结果的线性程度也比传统的方法要好。G-M计数管的使用寿命被大大延长。 综上所述，本文取得了如下成果：对国内外Time-To-Count方法的研究现状进行分析，指出了Time-To-Count测量方法的基本原理，并对Time-T0-Count方法理论进行了分析，推导出了计数前时间和两个相邻辐射粒子时间间隔之间的关系，从数学的角度论证了Time-To-Count方法的科学性。详细说明了基于ARM 7 LPC2132的Time-To-Count辐射测量仪的硬件设计、软件编程的过程，通过高速微处理芯片LPC2132的使用，成功完成了对基于MCS-51单片机的Time-To-Count测量仪的改进。改进后的辐射仪器具有量程宽、精度高、易操作、用户界面友好等特点。本论文根据实验结果总结出了Time-To-Count技术中的几点关键因素，如：处理器的频率、计数前时间、杂质时间、采样次数和测量时间等，重点分析了杂质时间的组成以及引入杂质时间的主要因素等，对国内核辐射测量仪的研究具有一定的指导意义。
标签： TimeToCount ARM 辐射测量仪
上传时间： 2013-06-24
上传用户：pinksun9
FEATURES Unique 1-Wire interface requires only one port pin for communication Multidrop capability simplifies distributed temperature sensing applications Requires no external components Can be powered from data line. Power supply range is 3.0V to 5.5V Zero standby power required Measures temperatures from -55°C to +125°C. Fahrenheit equivalent is -67°F to +257°F ±0.5°C accuracy from -10°C to +85°C Thermometer resolution is programmable from 9 to 12 bits Converts 12-bit temperature to digital word in 750 ms (max.) User-definable, nonvolatile temperature alarm settings Alarm search command identifies and addresses devices whose temperature is outside of programmed limits (temperature alarm condition) Applications include thermostatic controls, industrial systems, consumer products, thermometers, or any thermally sensitive system
上传时间： 2013-08-04
上传用户：CHENKAI
Abstract: Many digital devices incorporate analog circuits. For instance, microprocessors, applicationspecificintegrated circuits (ASICs), and field-programmable gate arrays (FPGAs) may have internalvoltage references, analog-to-digital converters (ADCs) or digital-to-analog converters (DACs). However,there are challenges when you integrate more analog onto a digital design. As with all things in life, inelectronics we must always trade one parameter for another, with the application dictating the propertrade-off of analog function. In this application note, we examine how the demand for economy of spaceand cost pushes analog circuits onto digital substrates, and what design challenges emerge.
上传时间： 2013-11-17
上传用户：菁菁聆听
Abstract: This design idea explains how to implement an 8-bit analog-to-digital converter (ADC), using a microcontroller
上传时间： 2013-10-30
上传用户：爱死爱死
Abstract: The DS4830 optical microcontroller's analog-to-digital converter (ADC) offset can change with temperature and gainselection. However, the DS4830 allows users to measure the ADC internal offset. The measured ADC offset is added to the ADCoffset register to nullify the offset error. This application note demonstrates the DS4830's ADC internal offset calibration in theapplication program.
上传时间： 2014-12-23
上传用户：萍水相逢
以某高速实时频谱仪为应用背景，论述了5 Gsps采样率的高速数据采集系统的构成和设计要点，着重分析了采集系统的关键部分高速ADC（analog to digital，模数转换器）的设计、系统采样时钟设计、模数混合信号完整性设计、电磁兼容性设计和基于总线和接口标准（PCI Express）的数据传输和处理软件设计。在实现了系统硬件的基础上，采用Xilinx公司ISE软件的在线逻辑分析仪（ChipScope Pro）测试了ADC和采样时钟的性能，实测表明整体指标达到设计要求。给出上位机对采集数据进行处理的结果，表明系统实现了数据的实时采集存储功能。
上传时间： 2014-11-26
上传用户：黄蛋的蛋黄
高速数字系统设计下载pdf:High-Speed Digital SystemDesign—A Handbook ofInterconnect Theory and DesignPracticesStephen H. HallGarrett W. HallJames A. McCallA Wiley-Interscience Publication JOHN WILEY & SONS, INC.New York • Chichester • Weinheim • Brisbane • Singapore • TorontoCopyright © 2000 by John Wiley & Sons, Inc.speeddigital systems at the platform level. The book walks the reader through everyrequired concept, from basic transmission line theory to digital timing analysis, high-speedmeasurement techniques, as well as many other topics. In doing so, a unique balancebetween theory and practical applications is achieved that will allow the reader not only tounderstand the nature of the problem, but also provide practical guidance to the solution.The level of theoretical understanding is such that the reader will be equipped to see beyondthe immediate practical application and solve problems not contained within these pages.Much of the information in this book has not been needed in past digital designs but isabsolutely necessary today. Most of the information covered here is not covered in standardcollege curricula, at least not in its focus on digital design, which is arguably one of the mostsignificant industries in electrical engineering.The focus of this book is on the design of robust high-volume, high-speed digital productssuch as computer systems, with particular attention paid to computer busses. However, thetheory presented is applicable to any high-speed digital system. All of the techniquescovered in this book have been applied in industry to actual digital products that have beensuccessfully produced and sold in high volume.Practicing engineers and graduate and undergraduate students who have completed basicelectromagnetic or microwave design classes are equipped to fully comprehend the theorypresented in this book. At a practical level, however, basic circuit theory is all thebackground required to apply the formulas in this book.
上传时间： 2013-10-26
上传用户：缥缈
利用单片机具有的智能程序控制的特点，设计了基于STC89C52单片机的"二极管特性测试器"，可对二极管一般特性进行快速测试。通过稳定线性电流源给二极管加载恒定电流，然后由高精度模数转换器测试其压降，以此为基础可判断二极管好坏、检测二极管极性和测试二极管伏安特性等，避免了用万用表测试只能测得极性而不知其特性这一缺点。可用于电子设计制作过程中对二极管进行快速测试，以确定被测二极管是否满足电路的设计要求。 Abstract: By making good use of the intelligent control function of the Micro Controller Unit (MCU)， the diode trait tester was designed based on the STC89C52，which could be used to test the trait of a diode rapidly. By loading constant current to diode through the stable linear current source， and measuring the voltage drop of the diode by high-precision analogue-to-digital converter (ADC)， it can judge whether the diode is good or not， distinguish the polarity of the diode， and test the trait that the diode， which can avoid the fault of using a multimeter can only measure the polarity but not the trait. This device can be used to test the trait of a diode quickly，and to make sure that whether a diode can be used in the electronic design or not.
上传时间： 2013-11-13
上传用户：assef
Luminary Micro provides an analog-to-digital converter (ADC) module on some members of theStellaris microcontroller family. The hardware resolution of the ADC is 10 bits; however, due to noiseand other accuracy-diminishing factors, the true accuracy is less than 10 bits. This application noteprovides a software-based oversampling technique, resulting in an improved Effective Number OfBits (ENOB) in the conversion result. This document describes methods of oversampling an inputsignal, and the impact on precision and overall system performance.
标签： Oversampling Techniques ADC fo
上传时间： 2013-12-17
上传用户：zhyiroy
Luminary Micro Stellaris™ microcontrollers that are equipped with an analog-to-digital converter(ADC), use an innovative sequence-based sampling architecture designed to be extremely flexible,yet easy to use. This application note describes the sampling architecture of the ADC. Sinceprogrammers can configure Stellaris microcontrollers either through the powerful StellarisFamilyDriver Library or through direct writes to the device's control registers, this application note describesboth methods. The information presented in this document is intended to complement the ADCchapter of the device datasheet, and assumes the reader has a basic understanding of howADCsfunction.
标签： Microcontr Stellaris Using the
上传时间： 2013-10-14
上传用户：blans
