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unit test 热门资料
汇集 unit test 相关的电路原理图、PCB工程文件、单片机/FPGA源代码、数据手册与应用设计方案。
A BIST (BUILT-IN SELF-TEST) STRATEGY FOR MIXED-SIGNAL INTEGRATED CIRCUITS
is a test of a verilog implementation to do a oscilloscope with dual-port RAM
《Software Test Automation》
3G module test program
A specific version of a quicksorter which can be used to test for efficiveness of different sorts
This Project implements a real-time operating system that can handle a SD/MMC Card unit
Universal Serial Bus Mass Storage Class Compliance Test Specification
ModScan and ModSim test Modbus Protocol
文章主要介绍ARM JTAG调试的基本原理。基本的内容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介绍,在此基础上,结合ARM7TDMI详细介绍了的JTAG调试原理。