INVITE sip:t.watson@ieee.org SIP/2.0 Via: SIP/2.0/UDP c.bell-tel.com From: A. Bell ;tag=3 To: T. Watson Call-ID: …
tel 源代码
TEL(测试与测量)技术是现代电子设计不可或缺的一部分,涵盖了从基础电路到复杂系统的所有层面。它不仅支持高效准确的故障诊断,还促进了产品质量的持续提升。在通信、汽车电子、医疗设备等多个领域中,TEL的应用日益广泛,成为确保产品性能和可靠性的关键。通过深入学习和掌握TEL相关知识,…
SIP/2.0 182 Queued, 1 caller ahead Via: SIP/2.0/UDP kton.bell-tel.com From: A. Bell ;tag=3 To: T. Watson ;tag=37462311 Call-I…
BYE sip:watson@y.bell-tel.com SIP/2.0 Via: SIP/2.0/UDP c.bell-tel.com From: A. Bell ;tag=3 To: T. Watson ;tag=35…
SIP/2.0 487 Request Terminated Via: SIP/2.0/UDP sip.ieee.org ;branch=3d8a50dbf5a28d.2 Via: SIP/2.0/UDP c.bell-tel.com F…
SIP/2.0 404 Not Found Via: SIP/2.0/UDP sip.ieee.org ;branch=3d8a50dbf5a28d.1 Via: SIP/2.0/UDP c.bell-tel.com From: A…
SIP/2.0 200 OK Via: SIP/2.0/UDP sip.ieee.org ;branch=3d8a50dbf5a28d.4 Via: SIP/2.0/UDP c.bell-tel.com Contact: sip:t…
SIP/2.0 200 OK Via: SIP/2.0/UDP sip.ieee.org ;branch=3d8a50dbf5a28d.3 Via: SIP/2.0/UDP c.bell-tel.com From: A. Be…
SIP/2.0 180 Ringing Via: SIP/2.0/UDP kton.bell-tel.com From: A. Bell ;tag=3 To: T. Watson ;tag=37462311 Call-ID: 662606876@kt…
INVITE sip:t.watson@ieee.org SIP/2.0 Via: SIP/2.0/UDP c.bell-tel.com From: Bell, Alexander To: Watson, Thomas Ca…
INVITE sip:t.watson@ieee.org SIP/2.0 Via: SIP/2.0/UDP c.bell-tel.com From: A. Bell To: T. Watson Call-ID: 31414@…