XAPP520将符合2.5V和3.3V I/O标准的7系列FPGA高性能I/O Bank进行连接
XAPP520将符合2.5V和3.3V I/O标准的7系列FPGA高性能I/O Bank进行连接 The I/Os in Xilinx® 7 series FPGAs are classified as either high range (HR) or high per...
XAPP520将符合2.5V和3.3V I/O标准的7系列FPGA高性能I/O Bank进行连接 The I/Os in Xilinx® 7 series FPGAs are classified as either high range (HR) or high per...
Xilinx Next Generation 28 nm FPGA Technology Overview Xilinx has chosen 28 nm high-κ metal gate (HKMG) highperformance,low-power process tech...
WP369可扩展式处理平台-各种嵌入式系统的理想解决方案 :Delivering unrivaled levels of system performance,flexibility, scalability, and integration to developers,Xilinx's...
Prakash Rashinkar has over 15 years experience in system design and verificationof embedded systems for communication satellites, launch vehicles and ...
磁芯电感器的谐波失真分析 摘 要:简述了改进铁氧体软磁材料比损耗系数和磁滞常数ηB,从而降低总谐波失真THD的历史过程,分析了诸多因数对谐波测量的影响,提出了磁心性能的调控方向。 关键词:比损耗系数, 磁滞常数ηB ,直流偏置特性DC-Bias,总谐波失真THD A...