Test+System
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2,087
Test+System 全部资料 2,087 份
cordic IC implement for fast cordic calculate. Including test bench. feature: 1. slicon proved.
cordic IC implement for fast cordic calculate. Including test bench. feature: 1. slicon proved. 2. support angle rec...
2017-01-06
176
Samsung S3C2440A SOC RISC Microprocessor test program that demonstrates how to code most peripherals
Samsung S3C2440A SOC RISC Microprocessor test program that demonstrates how to code most peripherals on the chip.
2013-12-20
87
This file contains a loop-back test for the audio part of the SmartRF04EB
This file contains a loop-back test for the audio part of the SmartRF04EB
2016-07-01
91
13、堆 MinHeap.h test.cpp 14、哈夫曼树 BinTreeNode.h BinaryTree.h MinHeap.h Huffman.h Test.
13、堆 MinHeap.h test.cpp 14、哈夫曼树 BinTreeNode.h BinaryTree.h MinHeap.h Huffman.h Test.cpp 15、树 164 Queu...
2017-08-14
164
test bed for cs5463 you write into cs5463 and read from it and configurit
test bed for cs5463 you write into cs5463 and read from it and configurit
2013-12-25
157
this code is such as a test code of interfacing microcontroller with MMC card
this code is such as a test code of interfacing microcontroller with MMC card
2013-12-16
34
vhdl 测试向量含测试向量（Test Bench）和波形产生：VHDL实例---相应加法器的测试向量（test bench).txt
vhdl 测试向量含测试向量（Test Bench）和波形产生：VHDL实例---相应加法器的测试向量（test bench).txt
2015-05-13
63
不错的课时管理系统包括程序文档)- Books management system management system (VFP) (including procedure documents)
不错的课时管理系统包括程序文档)- Books management system management system (VFP) (including procedure documents)
2014-01-08
151