Samsung S3C2440A SOC RISC Microprocessor test program that demonstrates how to code most peripherals
Samsung S3C2440A SOC RISC Microprocessor test program that demonstrates how to code most peripherals on the chip.
汇集 Aging+Test 相关的电路原理图、PCB工程文件、单片机/FPGA源代码、数据手册与应用设计方案。
Samsung S3C2440A SOC RISC Microprocessor test program that demonstrates how to code most peripherals on the chip.
RLT8186 gpio test driver example for hack
SEED-VPM642 Hardware Test子目录包含SEED-VPM642模板硬件测试程序,包含所有端口功能测试
The BuildBot is a system to automate the compile/test cycle required by most software projects. CVS commits trigger new builds, ru…
Data Minig中的FP GROWTH 算法,附带test实例及实验数据分析
This a framework to test new ideas in transmission technology. Actual development is a LDPC-coder in a MIMO-environment.
my test for duplicate entry in active directory for not univoce record
Rice University的Robin C. Sickles professor开发的专门用于paneldata model test and estimation 的program
Bluetooth 2.0 + EDR Test Specification 左蓝牙开发设计您那必须要的
some c++ exercise with solutions. Useful to test your knowledge for C++