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Taiwan sunplus develop spce3200, it is a test program ----- testboard source code

OPEN-JTAG ARM JTAG 測試原理 1 前言 本篇報告主要介紹ARM JTAG測試的基本原理。基本的內容包括了TAP (TEST ACCESS PORT) 和BOUNDARY-SCAN ARCHITECTURE的介紹，在此基礎上，結合ARM7TDMI詳細介紹了的JTAG測試原理。 2 IEEE Standard 1149.1 - Test Access Port and Boundary-Scan Architecture 從IEEE的JTAG測試標準開始 ...

ultrachip uc1698 test programe with MTP

The Ultimate IQ Test Book: 1,000 Practice Test Questions to Boost Your Brain Power 智商测试，现在遇到的招聘，为政府，军队，教育，工业和商业。 "最终的智商测试书" ，是本书最大的智商实践考验。笔试和汇编的智商测试专家，它包含1000个实践问题，组织了25种测试，一个简单的指导，以评估个人业绩。这个问题本身是 ...

s6d0118 c program test r g b white grp

SDL_Draw chinese test

MSP-FET430P410 Demo - Timer_A Toggle P5.1, CCR0 Contmode ISR, DCO SMCLK Description Toggle P5.1 using using software and TA_0 ISR. Toggle rate is set at 50000 DCO/SMCLK cycles. Default DCO frequency used for TACLK. Durring the TA_0 ISR P5.1 is toggled and 50000 clock cycles are added to CCR0. TA_ ...

MSP-FET430P140 Demo - USART0, SPI Interface to HC165/164 Shift Registers Description: Demonstrate USART0 in two-way SPI mode. Data are read from an HC165, and same data written back to the HC164. ACLK = n/a MCLK = SMCLK = default DCO = UCLK0 = DCO/2 * USART0 control bits are in different SFR s from ...

eeprom test of life by avr I2C 的控制和注意事项，带源码，please copy it and save as c

Test program for Canon PTP-enabled digital photocameras