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技术资料 8XC51SL应用技术资料更新(1996年)
The 8XC51SL may contain design defects or errors known as errata. Characterized errata that may caus
技术资料 28F016XS 应用技术资料更新(1996年)
The 28F016XS may contain design defects or errors known as errata. Characterized errata thatmay
技术资料 28F016SV 应用技术资料更新(1997年)
The 28F016SV may contain design defects or errors known as errata. Characterized errata thatmay
技术资料 3 V高级引导闪速存储器28F160B3技术资料更新(1999年)
The 28F160B3 may contain design defects or errors known as errata which may cause theproduct to
技术资料 8XC51FX、8XC51应用技术资料更新(1996年)
The 8XC51FX and 8XC51 may contain design defects or errors known as errata. Characterized errata tha
其他嵌入式/单片机内容 Nucleus GRAFIX Porting Guide
Nucleus GRAFIX Porting Guide，本文档包括Toolset Errors and Warnings 、
Display Device Initialization
Display Device Drivers、
Test Suite and Demo Program Modifications
软件设计/软件工程 While every precaution has been taken in the preparation of this book, the publisher assumes no re
While every precaution has been taken in the preparation of this book, the publisher assumes no
responsibility for errors or omissions, or for damages resulting from the use of the information
contained herein.
技术资料 PCIE3.0/4.0接收端（RX）介绍及其测试解决方案
• PCIe 3.0 introduced formal Rx testing• Based on stress testing of the DUT in loopback◦ Looped back data must be the same as stressed data• DUT must support loopback initialization and training• Impairments in stress must be controlled and repeatable• DUT must receive stressed signals without ...
技术资料 5 V自动引导块闪速存储器AB28F200BR, AB28F400BR应用技术资料更新(1999 年)
The AB28F200BR or AB28F400BR may contain design defects or errors known as errata.Characterized
技术资料 32,64 M位 英特尔StrataFlash 存储器技术资料更新(1998年)
The 28F320J5 and 28F640J5 may contain design defects or errors known as errata which maycause th