tst_main.h

数字信号处理芯片的测试源文件

/*--------------------------------------------------------*/
/*  WQ21ST SOFTWARE	STUDIO.			                  	  */
/*--------------------------------------------------------*/
/*
   main test include file for EVM320LF2407

   filename:    tst_main.h
   original:    07/26/2001   by: WQ
   last update: 08/29/2001   by: WQ
*/

#define LOW_BYTE_MASK  0x00FF

/*
  Macro Expansion Declarations
*/
#define _WSGR	   0FFFFh      /* wait state generator reg in I/O space */

#define STR(x) #x

#define OUTMAC(address,data)  \
 asm("        LDPK    _"STR(data));  \
 asm("        OUT     _"STR(data) "," STR(address))

#define INMAC(address,data)   \
 asm("        LDPK    _"STR(data));  \
 asm("        IN      _"STR(data) "," STR(address))