bench.xml

springer_-modeling_and_simulation_for_rf_system_design所有配套光盘源码5-11章

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<!DOCTYPE model SYSTEM "/usr/local/vamdoc-1.0.2-kluwer/config/model.dtd"><model>
  <symbol>../symbol/bench.png</symbol>
  <comments>
    <title>A2D test bench</title>
    <model_name>BENCH(TEST_A2D)</model_name>
    <library>N/A</library>
    <structure>N/A</structure>
    <description>The test-bench shows how a sine wave signal is digitalized<br></br>and converted back again to analog domain. Since the number<br></br>of bits for the resolution of the digital signal can be<br></br>choosen, effects of quantization can be studied.<br></br></description>
    <link_source><A HREF="../src/bench.vhd">See source code</A></link_source>
    <dependency>
      <library>IEEE_proposed</library>
      <design_unit>ELECTRICAL_SYSTEMS</design_unit>
    </dependency>
    <dependency>
      <library>IEEE</library>
      <design_unit>MATH_REAL</design_unit>
    </dependency>
    <dependency>
      <library>WORK</library>
      <design_unit>P_SIN(SINGLE_TONE)</design_unit>
    </dependency>
    <dependency>
      <library>WORK</library>
      <design_unit>A2D(BHV_RF)</design_unit>
    </dependency>
    <dependency>
      <library>WORK</library>
      <design_unit>D2A(BHV_RF)</design_unit>
    </dependency>
  </comments>
  <interface>
  </interface>
</model>