testanalog.h

epson usb2.0 控制芯片 S1R72V05 固件程序。

/*
 * description: Analog Test
 * Maker	  : Mie.Ono
 * Copyright  : (C)2005,SEIKO EPSON Corp. All Rights Reserved.
 */

//------- include gurd ------------------------------------------------------
#ifndef TEST_ANALOG_H
#define TEST_ANALOG_H

// ------- Linkage specification ------------------------------------------------------
#ifdef __cpulusplus
	extern "C" {
#endif /* cplusplus */

//==========================================================================//
//																			//
//						Constants declaration							//
//																			//
//==========================================================================//

#define TEST_BULK_XFER_SIZE			(0x10000)

#ifdef TOYA2_C
#define TEST_BULK_XFER_BUF_ADDR		(0xC3000000)
#else
#define TEST_BULK_XFER_BUF_ADDR		(0x11000000)
#endif

#define INT_ALL_CLEAR				(0xFF)
#define CHIP_RESET					(0xFFFF)

/* USB TID */
#define TID_SETUP				(0 << 6)	// Setup TID
#define TID_OUT_DATA			(1 << 6)	// Out Token TID
#define TID_IN_DATA				(2 << 6)	// In Token TID
#define TID_RESERVED			(3 << 6)	// Reserved

/* Condition Code */
#define NO_ERROR				(0)			// No Error
#define STALL					(1)			// Stall
#define DATA_OVER_RUN			(2)			// Data Over Run ( Max Packet Size < Receive Data Size )
#define DATA_UNDER_RUN			(3)			// Data Under Run ( Receive Data Size < Expected Data Size )
#define RETRY_ERROR				(4)			// Retry Error

extern volatile unsigned char V05Revision;

//==========================================================================//
//																			//
//					   Test API Applicasion Interface						//
//																			//
//==========================================================================//
extern void AnalogTestStart ( void );		// Analog Test Main

#ifdef __cplusplus
	}
#endif /* cplusplus */

#endif /* TEST_ANALOG_H */