fwbit_fwx.h

Curtiss-Wright Controls Embedded Computing公司的cw183板bsp源代码

/**********************************************************************
 *
 *   Copyright (c) 2005, Dy 4 Systems All rights reserved.
 *   This Source Code is the Property of Dy 4 Systems Inc. and
 *   can only be used in accordance with Source Code License
 *   Agreement of Dy 4 Systems Inc. dba (doing business as) 
 *   CURTISS-WRIGHT CONTROLS EMBEDDED COMPUTING, "CWCEC".
 *
 **********************************************************************/

/*FILE HEADER*****************************************************************
 *  Product Name:   BSP demo code
 *
 *  %name:          fwBit_fwx.h
 *
 *  Description:    Definitions for Built-In-Test (BIT) codes and structures.  
 *
 *  %created_by:    tissa %
 *  %date_created:  Thu Sep 30 2004 %
 * 
 *  Notes:
 *          
 *  History:
 *     01d, 18jul05, tis updated based on the fwx file fwBit.h version fwx_v4
 *     01c, 03mar05, tis updated the file up to the fwx file fwBit.h version fwx_v3
 *     01b, 30sep04, tis updated the file up to the fwx file fwBit.h version fwx_v2
 *     01a, 30sep04, tis created based on the fwx file fwBit.h version 7
 *
 *END FILE HEADER*************************************************************/

#ifndef _FW_BIT_H_
#define _FW_BIT_H_

/*---------------------------------------------------------------------------*/
/* compiler switches */
#ifdef __cplusplus
extern "C"
{
#endif

/*---------------------------------------------------------------------------*/
/* constant definitions */
/* BIT test types */
typedef enum 
{
    FW_TEST_RESET_BITS = 0,               /* 0 */
    FW_TEST_TOGGLE_BITS,                  /* 1 */
    FW_TEST_ADDRESS_CONVERGENCE,          /* 2 */
    FW_TEST_DATA_CONVERGENCE,             /* 3 */
    FW_TEST_LOOPBACK,                     /* 4 */
    FW_TEST_MISALIGNED,                   /* 5 */
    FW_TEST_BACKUP_POWER,                 /* 6 */                 
    FW_TEST_ALARM_ACCURACY,               /* 7 */
    FW_TEST_INTERRUPT_MODE,               /* 8 */
    FW_TEST_POLL_MODE,                    /* 9 */                    
    FW_TEST_CRC_COMPARE,                  /* 10 */
    FW_TEST_BLOCK_READ_WRITE_RESTORE,     /* 11 */
    FW_TEST_TIMER_ACCURACY,               /* 12 */               
    FW_TEST_TIMER_CASCADE,                /* 13 */
    FW_TEST_DEVICE_PRESENT_VERIFY,        /* 14 */
    FW_TEST_CACHE_HIT_MISS,               /* 15 */

    /* add more test handles above this line */
    eFW_TEST_HANDLE_END,

    /* Code execution check handles */
    FW_CHECK_PCI_PROGRAM = 0x100,         /* 256- PCI device mapping programming check */
    FW_CHECK_DEVICE_PROGRAM,              /* 257- Device programming registers check */
    FW_CHECK_MEM_FILL,                    /* 258- Memory fill check */
    FW_CHECK_CBOOT,                       /* 259- CBOOT validity check */
    FW_CHECK_CODE,                        /* 260- Code validity check */
    FW_CHECK_DEVICE_RW,                   /* 261- Device read/write check */
    FW_CHECK_DEVICE_HANDLE,               /* 262- Device handle check */
    FW_CHECK_DEVICE_CONFIG,               /* 263- Device config check */
    FW_CHECK_DEVICE_RENDEZVOUS,           /* 264- Device rendezvous check */
    /* add more code check handles above this line */
    eFW_CHECK_HANDLE_END

} eFW_TEST_HANDLE;

/* The following is used to define BIT functions */
typedef eFW_RTCODE (*pFW_BIT_FUNCTION_PROTOTYPE)(const sFW_DEVICE_RECORD *pDeviceRecord, const sFW_TEST_PARAMS *, sFW_ERROR *);

/* BIT impact attribute */
typedef enum 
{

    FW_TEST_EFFECT_DESTRUCTIVE = 0,
    FW_TEST_EFFECT_NON_DESTRUCTIVE,

    /* add more test effect above this line */
    eFW_TEST_EFFECT_END

} eFW_TEST_EFFECT;

/*---------------------------------------------------------------------------*/
/* structure definitions */

/* test information structure */
typedef struct 
{
    pFW_BIT_FUNCTION_PROTOTYPE bitFunctionPtr;
    eFW_TEST_EFFECT            bitImpact;
} sFW_TEST_RECORD;


#ifdef __cplusplus
}
#endif

#endif  /* _FW_BIT_H_ */