post.c

TMS320C6711的上电自检 This source code is ultimately used to create a JEDEC programming file used * to p

/*******************************************************************************
* $Source$
* $Revision$
* $Date$
*
* Copyright (C) 1990-2000 Texas Instruments Incorporated.
* All rights reserved.
*******************************************************************************/
/*******************************************************************************
* FILENAME
*   post.c
*
* DESCRIPTION
*   Power-On Self-Test code programmed into the TMS320C6211/6711 DSK Flash ROM.
*
* !!NOTE!!
*  Any future revision of this code should reorder the tests such that the
*  timer test is conducted first. In its present form the timer is used in all
*  tests (delay_msec()) prior to its own specific test. This could allow a timer
*  failure to be misdiagnosed as another test's failure(code displayed on LEDs).
* !!NOTE!!
*
* PUBLIC FUNCTIONS
*   None.
*
* PRIVATE FUNCTIONS
*   All.
*
* AUTHOR
*  chenhao
*
* NOTES
*   This source code is ultimately used to create a JEDEC programming file used
*   to program the Flash ROM on the 'C6211 DSK.
*
* UPDATE
*   Changed SDRAM parameters.
*   Reduced time for tests by 90%
*
*******************************************************************************/
#include <stdio.h>
#include <c6x.h>
#include "c6211dsk.h"
#define LED  0x90090011    //指示灯的地址,实验证明其地址不是唯一
 
/*******************************************************************************
* Function prototypes
*******************************************************************************/
/*******************************************************************************
* FUNCTION : main
*
* ARGUMENTS :
*   VOID
*
* DESCRIPTION :
*   The code, at power-up, executes to perform a series of tests. The LEDs on
*   the DSK display progress codes during execution and a diagnostic or pass
*   code upon detection of an error or completion.
*
* OUTPUTS :
*   
*   LED Diagnostic Codes: (0=off, 1=on)
*   C     L L L
*   O     E E E
*   D     D D D
*   E     2 1 0
*   -     - - -
*   0     0000 Start state
*   1     0001 TEST 1: DSP internal SRAM test
*   2     0010 TEST 2: External SDRAM test
*   3     0011 TEST 3: DSP McBSP0 loopback test
*   4     0100 TEST 4: External codec read/write test
*   5     0101 TEST 5: External codec tone generation test
*   6     0110 TEST 6: External LED and DSP timer tests
*   7     0111 TEST 7: UNUSED/AVAILABLE FOR FUTURE TEST USE
*   linkfunction:   All tests completed successfully
*   0     1111
*   1     1110
*   2     1101
*   3     1100
*   4     1011
*   5     1010
*   6     1001
*   7     1000
*   8     0111
*   INT 0
*******************************************************************************/
void main()

{
   while(1)
   {
     /* DSP initialization*/
     unsigned  char data;
     volatile  unsigned  char* ledflash = (volatile unsigned  char *) LED ;
     CSR=0x100;                           /* Disable all interrupts              */
     IER=1;                               /* Disable all interrupts except NMI   */
     ICR=0xffff;                          /* Clear all pending interrupts        */

/*************************************************************************
* Standard 6211/6711 DSK includes 2 MT48LC4M16A2TG-7E_H devices = 4MB SDRAM   *
* For these devices use the following parameter:                         *
*   EMIF_SDCTRL=0x07126000                                               *
* If MT48LC1M16A1-10 devices are installed use the following parameter:  *
*   EMIF_SDCTRL=0x07227000                                               *
* /|\ 16Mb parts = 4MB SDRAM /|\   *-------------------------------------*
*----------------------------------*   \|/ 64Mb parts = 16MB SDRAM \|/   *
* If MT48LC4M16A2-10 devices are installed use the following parameter:  *
*   EMIF_SDCTRL=0x57227000                                               *
*************************************************************************/

      *(unsigned volatile int *)EMIF_GCR = 0x3360;    /* EMIF global control      */
      *(unsigned volatile int *)EMIF_CE1 = CE1_8;    /* EMIF CE1 control, 32bit  */
      *(unsigned volatile int *)EMIF_SDCTRL = 0x07126000; /* EMIF SDRAM control   */ 
      *(unsigned volatile int *)EMIF_CE0 = 0xFFFFFF33;      /* EMIF CE0 control         */
      *(unsigned volatile int *)EMIF_SDRP = 0x61a;    /* EMIF SDRM refresh period */
      *(unsigned volatile int *)EMIF_SDEXT= 0x54529;  /* EMIF SDRM extension      */
  
  /*****************************************************************************
   * Start state
   ****************************************************************************/
      delay_msec(500);           /*延时500ms*/
      data=0x0f;                /*  赋给灯地址单元的值    */
      ledplayer(ledflash,data); /* Turn off all user LEDs*/
      delay_msec(500);          /*延时500ms*/

  /*****************************************************************************
   * TEST 1: DSP internal SRAM test
   ****************************************************************************/
      data=0x0e;                 /*  赋给灯地址单元的值    */
      ledplayer(ledflash,data);  /*  赋给灯地址单元的值 ,使第一个灯亮   */
      delay_msec(500);

      /*L2内部存储器读写检查*/
      if(mem_test(ALL_5,INTERNAL_MEM_START,INTERNAL_MEM_SIZE) != 0) 
      {
       exit(0);
      } 

      if(mem_test(ALL_A,INTERNAL_MEM_START,INTERNAL_MEM_SIZE) != 0)
      {
       exit(0);
       } 

  /*****************************************************************************
   * TEST 2: External SDRAM test
   ****************************************************************************/
      data=0x0d;         /*  赋给灯地址单元的值    */
      ledplayer(ledflash,data);   /*  赋给灯地址单元的值,使第二个灯亮 */       
      delay_msec(500);
      
       /*EMIF接口CE0外部存储器SDRAM读写检查*/
       if(mem_test(ALL_5,EXTERNAL_MEM_START,EXTERNAL_MEM_SIZE) != 0)
        {
           exit(0);
        } 
 
      if(mem_test(ALL_A,EXTERNAL_MEM_START,EXTERNAL_MEM_SIZE) != 0)
       {
          exit(0);
       } 
   
  /*****************************************************************************
   * TEST 3: DSP McBSP0 loopback test
   ****************************************************************************/
      data=0x0c;
      ledplayer(ledflash,data);
      delay_msec(500);
 
       if (mcbsp0_test () != 0) /*串行口数据接收检查*/
        {
          exit(0);
        } 
 
  /*****************************************************************************
   * TEST 4: External codec read/write test
   ****************************************************************************/
        data=0x0b;
        ledplayer(ledflash,data);
        delay_msec(500);

         mcbsp0_init();        /*串行口初始化*/
 //play_codec(5000, 0);
  
  /*****************************************************************************
   * TEST 5: External codec tone generation test
   ****************************************************************************/
        data=0x0a;
        ledplayer(ledflash,data);
        delay_msec(500);

         mcbsp0_init();
// play_codec(200, 1);/*generate 1KHz tone for 1 sec */

  /*****************************************************************************
  * TEST 6: External LED and DSP timer tests
  *****************************************************************************/
        data=0x09;
        ledplayer(ledflash,data);
        delay_msec(100);

  /*****************************************************************************
  * TEST 7: UNUSED/AVAILABLE FOR FUTURE TEST USE
  *****************************************************************************/

  /*****************************************************************************
  * All tests completed successfully
  *****************************************************************************/
      led_blink(8, 1000,ledflash);
 }
 
}

/*******************************************************************************
* FUNCTION : mem_test
*
* ARGUMENTS :
*   INT pattern           <-- Pattern to be written or read from the memory
*   INT start_address     <-- Address from which to start testing memory
*   INT size_in_word      <-- Number of words to test in memory
*
* DESCRIPTION :
*   Write the pattern to memory beginning at the start_address through the
*   number of locations specified by size_in_word. Read the same locations
*   and generate an error if the value read back differs from the pattern
*   written.
*
* OUTPUTS :
*   INT error             <-- True if value read differs from pattern written
*
*******************************************************************************/
int mem_test (int pattern, int start_address, int size_in_word )
{
  int i;
  int error = 0;
  int *mem_ptr = (int *)start_address;

  /* Write pattern to the memory */
  for(i=0;i<size_in_word;i++)
  {
    *mem_ptr++ = pattern;
  }

  /* Read memory and compare contents to the pattern written */
  mem_ptr = (int *)start_address;
  for(i=0;i<size_in_word;i++)
  {
    if ( *mem_ptr++ != pattern) error++;
  }
  return error;
}

/*******************************************************************************
* FUNCTION : mcbsp0_init
*
* ARGUMENTS :
*   VOID
*
* DESCRIPTION :
*   Initializes multi-channel serial port 0 for 16 bits of data per frame in 
*   slave mode.
*
* OUTPUTS :
*   VOID
*
*******************************************************************************/
void mcbsp0_init()
{
  /* Setup McBSP0 */
  volatile unsigned int temp =0;

  /* Reset serial port */
  *(unsigned volatile int *)McBSP0_SPCR = 0; 

  /* Set pin control reg */