compat-common.h
来自「xml大全 可读写调用率很高 xml大全 可读写调用率很高」· C头文件 代码 · 共 29 行
H
29 行
/* Several of the binary compatibility tests use these macros to allow debugging the test or tracking down a failure by getting an indication of whether each individual check passed or failed. When DBG is defined, each check is shown by a dot (pass) or 'F' (fail) rather than aborting as soon as a failure is detected. */ #ifdef DBG#include <stdio.h>#define DEBUG_INIT setbuf (stdout, NULL);#define DEBUG_FPUTS(x) fputs (x, stdout)#define DEBUG_DOT putc ('.', stdout)#define DEBUG_NL putc ('\n', stdout)#define DEBUG_FAIL putc ('F', stdout); fails++#define DEBUG_CHECK { DEBUG_FAIL; } else { DEBUG_DOT; }#define DEBUG_FINI if (fails) DEBUG_FPUTS ("failed\n"); \ else DEBUG_FPUTS ("passed\n");#else#define DEBUG_INIT#define DEBUG_FPUTS(x)#define DEBUG_DOT#define DEBUG_NL#define DEBUG_FAIL abort ()#define DEBUG_CHECK abort ();#define DEBUG_FINI#endifextern void abort (void);extern int fails;
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