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<title>Roy M. Jenevein, Jr.</title><!WA0><!WA0><img src="http://www.cs.utexas.edu/users/UTCS/report/1994/profiles/jenevein.gif"> <br><h1>Roy M. Jenevein, Jr.</h1><i>Senior Lecturer <p>B.S. in Chemistry (1964), Ph.D. in Chemistry (1969) <br>Louisiana State University in New Orleans <p></i><h2>Areas of Interest</h2>Interconnection networks and parallel processing in computer architecture <p><h2>Summary of Research</h2>My research in computer architecture focuses on <i>interconnectionnetworks.</i> The success or failure of parallel computing systems restsin the ability to devise appropriate cost/performance interconnectionstructures. The most recent work on interconnections involves thedevelopment of a wafer scale optical interconnection. A special kindof laser and wave guide has been designed and is beinginvestigated. This technique leads to very fault-tolerant parallelsystems on the wafer. This same optical interconnection is beingapplied to optical systems busses and optical communicationswitches. Work on the performance of processor systems iscontinuing. A methodology for measuring processor performanceportability across machines has been developed. In contrast tobenchmarking, it represents true measurement of a processor/memorysystem. <p><h2>Selected Recent Publications</h2>R. M. Jenevein and B. L. Menezes, "The KYKLOS multicomputer networks: interconnection strategies, properties, applications.," <i>IEEE Transactions on Computers</i>, vol. C-40, no. 6, pp. 693-705, June 1991. <p>R. M. Jenevein, L. Laranjeira, and M. M. Malek, "NEST: a nested predicate scheme for fault tolerance," <i>IEEE Transactions on Computers</i>, in press, 1993 <p>R. M. Jenevein and N. Ullah, "MetriX: a precise methodology for computer system performance measurement," in <i>Proceedings of the 1993 International Conference for Computer Applications in Industry and Engineering</i>, December 1993. <p>R. M. Jenevein, B. L. Menezes, A. Johnson, M. M. Malek, and K. Yau, "Fault impact and fault tolerance in multiprocessor interconnection networks," <i>Journal of Quality and Reliability Engineering</i>, vol. 8, pp. 485-500, October 1992. <p>R. M. Jenevein and J. C. Campbell, "A wafer scale optical bus interconnection prototype," in <i>Proceedings of the 1992 International Conference on Wafer Scale Integration</i>, pp. 182-191, January 1992. <p>Additional information can be obtained from<!WA1><!WA1><a href="http://www.cs.utexas.edu/docs/prof.html">individual faculty members'home pages</a>. <p><!WA2><!WA2><a href="http://www.cs.utexas.edu/users/UTCS/report/1995/profiles/index.html"><!WA3><!WA3><img src="http://www.cs.utexas.edu/icons/UTCS/up.gif">Back to List of Faculty Profiles</a> <br><P>
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