📄 test_includes.h
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/*********************************************************************
(c) copyright Freescale Semiconductor Hong Kong Ltd. 2002
ALL RIGHTS RESERVED
*********************************************************************
Test Driver Module for S12 MCUs
*********************************************************************
File: test_includes.h
Description: Define my System Configuration & Compiler Options.
Date: Oct. 2004
Author: Derek Lau
********************************************************************/
#ifndef _TEST_INTRN_GLOBAL_DECL_
#define _TEST_INTRN_GLOBAL_DECL_ extern
#endif
#ifndef _H_TEST_INCLUDES_ // To avoid multiple defining
#define _H_TEST_INCLUDES_ // start of Constants & Macros definition
#include "Hidef.h"
muint8 ATA_TestInit(muint8 ResetPin, volatile muint8 *ResetPort);
muint8 CF_TestInit(void);
void main(void);
void Init_System(void);
void Init_IQUE(void);
void Init_Buffer(void);
void Fill_Buffer(muint8 data, muint16 startaddr);
void Init_PLL(void);
void Test_ReadW(muint16 no_of_blk, muint8 segment, muint16 phyblk);
void SD_TestReadW(muint16 no_of_blk, muint32 lba);
void Move2QUE1(muint8 *FR_ptr, muint16 Len);
void Test_Page_Program32(muint8 page, muint16 phyblk);
void Test_Page_Program(muint32 lba);
#pragma TRAP_PROC
void USB_StartFrameISR(void){};
void USB_PhyEP6ISR(void){};
void USB_PhyEP5ISR(void){};
void USB_PhyEP4ISR(void){};
void USB_PhyEP3ISR(void){};
void USB_PhyEP2ISR(void){};
void USB_EP0OUTISR(void){};
void USB_EP0INISR(void){};
void USB_SetConfigISR(void){};
void USB_SetupISR(void){};
void USB_StatusChgISR(void){};
#ifndef _H_SD_INCLUDES_
void SD_Irq_Interrupt(void){};
#endif
#endif _H_Test_INCLUDES_ // end of my Constants & Macros definition
//
// The end of file test_includes.h
// *********************************************************************************
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