run_test.h

来自「本测试程序是针对TMS320LF2407 EVM的性能测试而设计开发的。程序运行」· C头文件 代码 · 共 26 行

/*--------------------------------------------------------*/
/*  WQ21ST SOFTWARE	STUDIO.			                  	  */
/*--------------------------------------------------------*/
/*--------------------------------------------------------*/
/* run test include file				 				  */
/*							 							  */
/* filename:	run_test.h				 				  */
/* original:	07/22/2001     by: WQ					  */
/* last update: 08/29/2001     by: WQ			          */
/*--------------------------------------------------------*/

#define NO_RUN  0x0000
#define RUN     0x0001


#define TEST1	   RUN	    /* data space ram test	  */
#define TEST2	   RUN	    /* code space ram test	  */
#define TEST3	   RUN	    /* onchip uart loopback test  */
#define TEST4	   RUN	    /* dac loopback test	  */
#define TEST5	   RUN	    /* led test 		  */
#define TEST6	   RUN	    /* latch led test		  */
#define TEST7	   RUN	    /* dip switch test		  */