Design for manufacturability and statistical design encompass a number of activities and areas of study spanning the integrated circuit design and manufacturing worlds. In the early days of the planar integrated circuit, it was typical for a handful of practitioners working on a particular design to have a fairly complete understanding of the manufacturing process, the resulting semiconductor active and passive devices, as well as the resulting circuit - often composed of as few as tens of devices. With the success of semiconductor scaling, predicted and - to a certain extent even driven - by Moore’s law, and the vastly increased complexity of modern nano-meter scale processes and the billion-device circuits they allow, there came a necessary separation between the various disciplines.
标签： Manufacturability Statistical Design for and
上传时间： 2020-06-10
上传用户：shancjb
CHAPTER 1: THE OP AMP CHAPTER 2: OTHER LINEAR CIRCUITS CHAPTER 3: SENSORS CHAPTER 4: RF/IF CIRCUITS CHAPTER 5: FUNDAMENTALS OF SAMPLED DATA SYSTEMS CHAPTER 6: CONVERTERS CHAPTER 7: DATA CONVERTER SUPPORT CIRCUITS CHAPTER 8: ANALOG FILTERS CHAPTER 9: POWER MANAGEMENT CHAPTER 10: passive COMPONENTS CHAPTER 11: OVERVOLTAGE EFFECTS ON ANALOG INTEGRATED CIRCUITS CHAPTER 12: PRINTED CIRCUIT BOARD (PCB) DESIGN ISSUES CHAPTER 13: DESIGN DEVELOPMENT TOOLS
上传时间： 2021-12-21
上传用户：wangshoupeng199
