高斯脉冲的峰值频率。把各阶导函数的ESD作为α的函数，确定其峰值频率的数值。
上传时间： 2014-01-07
上传用户：ljmwh2000
电子工艺,质量及可靠性相关专辑 80册 902MESD电路与器件 34页 8.6M.pdf
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上传时间： 2014-05-05
上传用户：时代将军
电子企业工程师ESD培训材料，用于电子企业的静电保护
标签： ESD
上传时间： 2015-06-08
上传用户：ttkkkk
ESD资料信息详细内容，分享0000000000
上传时间： 2016-05-16
上传用户：desay
ESD管理流程ESD管理流程ESD管理流程ESD管理流程
上传时间： 2016-05-16
上传用户：desay
This effort started as an answer to the numerous questions the authors have repeatedly had to answer about electrostatic discharge (ESD) protection and input/output (1/0) designs. In the past no comprehensive book existed suffi- ciently covering these areas, and these topics were rarely taught in engineering schools. Thus first-time I/O and ESD protection designers have had consider- able trouble getting started. This book is in part an answer to such needs.
上传时间： 2020-06-05
上传用户：shancjb
Contamination and electrostatic discharge (ESD) are now becoming recognized as factors affecting yield and reliability in an ever-increasing number of industries. Whereas contam- ination traditionally was recognized as affecting the semiconductor, disk drive, aerospace, pharmaceutical, and medical device industries, today such industries as automobile and food production are also discovering the benefits of contamination control. ESD control has experienced a similar growth in applications.
标签： Contamination Control and ESD
上传时间： 2020-06-05
上传用户：shancjb
Electrostatic discharge (ESD) phenomena have been known to mankind since the Greek Empire when Thales of Miletus, one of the Seven Sages of Greece, noticed the attraction of strands of hay to amber, leading to the coining of the word ‘‘electron.’’ In the 17th century, Gilbert and Cabeo addressed the attractive and repulsive nature of electricity. In the 18th century, a rapid increase of interest occurred for scientists in the understanding of electrical physics—Gray, du Fay, Nollet, Musschenbroeck, Franklin, Watson, Aepinus, Canton,
上传时间： 2020-06-05
上传用户：shancjb
Failure analysis is invaluable in the learning process of electrostatic discharge (ESD) and electrical overstress (EOS) protection design and development [1–8]. In the failure analysis of EOS, ESD, and latchup events, there are a number of unique failure analysis processes andinformationthatcanprovidesignificantunderstandingandillumination[4].Today,thereis still no design methodology or computer-aided design (CAD) tool which will predict EOS, ESDprotectionlevels,andlatchupinasemiconductorchip;thisisoneofthesignificantreasons why failure analysis is critical to the ESD design discipline.
标签： Mechanisms Failure Models ESD and
上传时间： 2020-06-05
上传用户：shancjb
Electrostatic discharge (ESD) phenomena have been known to mankind since Thales of Miletus in approximately 600 B.C.E. noticed the attraction of strands of hay to amber. Two thousand six hundred years have passed and the quest to obtain a better under- standing of electrostatics and ESD phenomenon continues. Today, the manufacturing of microelectronics has continued the interest in the field of electrostatic phenomenon spanning factory issues, tooling, materials, and the microelectronic industry
上传时间： 2020-06-05
上传用户：shancjb
