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densities

  • Classify using the minimum error criterion via histogram estimation of the densities

    Classify using the minimum error criterion via histogram estimation of the densities

    标签: estimation the criterion densities

    上传时间: 2015-08-28

    上传用户:wang0123456789

  • we shall examine nonparametric procedures that can be used with arbitrary distributions and without

    we shall examine nonparametric procedures that can be used with arbitrary distributions and without the assumption that the forms of theunderlying densities are known.

    标签: distributions nonparametric procedures arbitrary

    上传时间: 2016-02-26

    上传用户:songnanhua

  • Silicon-Based+RF+Front-Ends

    Ultra-wideband (UWB) technology enables high data-rate short-range communica- tion, in excess of hundredmegabit-per-secondsand up to multi-gigabit-per-seconds, over a wide spectrum of frequencies, while keeping power consumption at low lev- els. This low power operation results in a less-interfering co-existence with other existed communication technologies (e.g., UNII bands). In addition to carrying a huge amount of data over a distance of up to 230 feet at very low power (less than 0.5mW), the UWB signal has the ability to penetrate through the doors and other obstacles that tend to reflect signals at more limited bandwidths and higher power densities.

    标签: Silicon-Based Front-Ends RF

    上传时间: 2020-05-31

    上传用户:shancjb

  • ESD Protection Device and Circuit Design

    The challenges associated with the design and implementation of Electro- static Discharge (ESD) protection circuits become increasingly complex as technology is scaled well into nano-metric regime. One must understand the behavior of semiconductor devices under very high current densities, high temperature transients in order to surmount the nano-meter ESD challenge. As a consequence, the quest for suitable ESD solution in a given technology must start from the device level. Traditional approaches of ESD design may not be adequate as the ESD damages occur at successively lower voltages in nano-metric dimensions.

    标签: Protection Circuit Device Design ESD and

    上传时间: 2020-06-05

    上传用户:shancjb